TRANSVERSE VELOCITY FOR DIAGONAL PROBES; ESTIMATION, UNCERTAINTY QUANTIFICATION, AND SENSITIVITY ANALYSIS
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Engineering topics
Publications and source records attributed to Lund, Margaret C.
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High-brightness X-ray pulses, as generated at synchrotrons and X-ray free electron lasers (XFELs), are used in a variety of scientific experiments. At these facilities, measurements often require optical equipment, e.g Compound Refractive Lenses (CRLs) to be precisely aligned and focused. The lateral alignment of CRLs to a beamline requires precise positioning along four axes: two translational, and the two rotational. At a synchrotron, alignment is often accomplished manually. However, XFEL beamlines present a beam brightness that fluctuates stochastically, making manual alignment a time-consuming endeavor. Automation using simplex or classic stochastic descent often fails, given the errant gradient estimates. Herein we present a dynamic-amplitude correction to the usual gradient based on the combination of a generalized finite difference stencil and a time-dependent sampling pattern. Intensity is recorded periodically, then used to normalize numerical derivatives against fluctuations. Error expectation is analyzed, and efficacy is demonstrated on classic benchmarks. We provide a proof of concept by laterally aligning optics on a simulated XFEL beamline using data recorded at both synchrotron and XFEL facilities.
Presentation will be given at university level.
This is my 2-page end of year report for my SDRD which will continue in FY22.
Presentation to be presented during the Site-Directed Research and Development (SDRD) Program FY 2021 Review Meeting (webex), September 22–23, 2021.