Engineering topics
Publications and source records attributed to Lynn, K. G..
We report radiation damage induced by a 2 keV low-current-density positron beam and observed by positron annihilation spectroscopy.
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Explore the source record for details and available documents.
Explore the source record for details and available documents.
We use positron annihilation spectroscopy to study positron kinetics in electrically-biased metal-oxide-silicon system and trapping at the SiO2/Si interface.
Specular reflection of positronium, Ps was observed and that there is adequate intensity at higher energies to make further study worthwhile was established. The scattering appears to be restricted to the outermost surface with a mean free path of (0.75 + or - 0.15)A for Ps in LiF(100). With a greater intensity Ps beam one should see higher order diffraction beams as the result of the periodicity of the surface. Ps diffraction thus offers the possibility of being a novel and valuable probe to study the outermost surface and to study adsorbants on it. Two methods for producing Ps beams are described.