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Maddox, B. R.

Publications and source records attributed to Maddox, B. R..

Spall strength dependence on grain size and strain rate in tantalum

In this paper, we examine the effect of grain size on the dynamic failure tantalum during laser-shock compression and release and identify a significant effect of grain size on spall strength, which is opposite to the prediction of the Hall-Petch relationship because spall is primarily intergranular in both poly and nanocrystalline samples; thus, monocrystals have a higher spall strength than polycrystals, which, in turn, are stronger in tension than ultra-fine grain sized specimens. Post-shock characterization reveals ductile failure which evolves by void nucleation, growth, and coalescence. Whereas in the monocrystal the voids grow in the interior, nucleation is both intra and intergranular in the poly and ultra-fine-grained crystals. The fact that spall is primarily intergranular in both poly and nanocrystalline samples is strong evidence for higher growth rates of intergranular voids, which have a distinctly oblate spheroid shape in contrast with intragranular voids, which are more spherical. The length geometrically-necessary dislocations required to form a grain-boundary (intergranular) void is lower than that of grain-interior (intragranular) void with the same maximum diameter; thus, the energy required is lower. Consistent with prior literature and theory we also identify an increase with spall strength with strain rate from 6x10 6 to 5x10 7 s -1 . Molecular dynamics calculations agree with the experimental results and also predict grain-boundary separation in the spalling of polycrystals as well as an increase in spall strength with strain rate. Finally, an analytical model based on the kinetics of nucleation and growth of intra and intergranular voids and extending the Curran-Seaman-Shockey theory is applied which shows the competition between the two processes for polycrystals.

36 MATERIALS SCIENCE↗

Single-pulse x-ray diffraction using polycapillary optics for in situ dynamic diffraction

Diagnostic use of single-pulse x-ray diffraction (XRD) at pulsed power facilities can be challenging due to factors such as the high flux and brightness requirements for diffraction and the geometric constraints of experimental platforms. By necessity, the x-ray source is usually positioned very close, within a few inches of the sample. On dynamic compression platforms, this puts the x-ray source in the debris field. We coupled x-ray polycapillary optics to a single-shot needle-and-washer x-ray diode source using a laser-based alignment scheme to obtain high-quality x-ray diffraction using a single 16 ns x-ray pulse with the source >1 m from the sample. Additionally, the system was tested on a Mo sample in reflection geometry using 17 keV x-rays from a Mo anode. We also identified an anode conditioning effect that increased the x-ray intensity by 180%. Quantitative measurements of the x-ray focal spot produced by the polycapillary yielded a total x-ray flux on the sample of 3.3 ± 0.5 × 10 7 molybdenum Kα photons.

47 OTHER INSTRUMENTATION↗