Engineering topics

Madison, Timothy J.

Publications and source records attributed to Madison, Timothy J..

8 records

NASA NTRS2014

Ambient Optomechanical Alignment and Pupil Metrology for the Flight Instruments Aboard the James Webb Space Telescope

The James Webb Space Telescope science instruments are in the final stages of being integrated into the Integrated Science Instrument Module (ISIM) element. Each instrument is tied into a common coordinate system through mechanical references that are used for optical alignment and metrology within ISIM after element-level assembly. In addition, a set of ground support equipment (GSE) consisting of large, precisely calibrated, ambient, and cryogenic structures are used as alignment references and gauges during various phases of integration and test (I&T). This GSE, the flight instruments, and ISIM structure feature different types of complimentary metrology targeting. These GSE targets are used to establish and track six degrees of freedom instrument alignment during I&T in the vehicle coordinate system (VCS). This paper describes the optomechanical metrology conducted during science instrument integration and alignment in the Spacecraft Systems Development and Integration Facility (SSDIF) cleanroom at NASA Goddard Space Flight Center (GSFC). The measurement of each instrument's ambient entrance pupil location in the telescope coordinate system is discussed. The construction of the database of target locations and the development of metrology uncertainties is also discussed.

Optomechanical Alignment↗

NASA NTRS2007

Cryogenic Temperature-dependent Refractive Index Measurements of N-BK7, BaLKN3, and SF15 for NOTES PDI

In order to enable high quality lens designs using N-BK7, BaLKN3, and SF15 at cryogenic temperatures, we have measured the absolute refractive index of prisms of these three materials using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, as a function of both wavelength and temperature. For N-BK7, we report absolute refractive index and thermo-optic coefficient (dn/dT) at temperatures ranging from 50 to 300 K at wavelengths from 0.45 to 2.7 micrometers; for BaLKN3 we cover temperatures ranging from 40 to 300 K and wavelengths from 0.4 to 2.6 micrometers; for SF15 we cover temperatures ranging from 50 to 300 K and wavelengths from 0.45 to 2.6 micrometers. We compare our measurements with others in the literature and provide temperature-dependent Sellmeier coefficients based on our data to allow accurate interpolation of index to other wavelengths and temperatures. While we generally find good agreement (plus or minus 2 x 10(exp -4) for N-BK7, less than 1 x 10(exp -4) for the other materials) at room temperature between our measured values and those provided by the vendor, there is some variation between the datasheets provided with the prisms we measured and the catalog values published by the vendor. This underlines the importance of measuring the absolute refractive index of the material when precise knowledge of the refractive index is required.

Frey, Bradley J.↗

NASA NTRS2007

Temperature-dependent Refractive Index of CaF2 and Infrasil 301

In order to enable high quality lens designs using calcium fluoride (CaF2) and Heraeus Infrasil 301 (Infrasil) for cryogenic operating temperatures, we have measured the absolute refractive index of these two materials as a function of both wavelength and temperature using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center. For CaF2, we report absolute refractive index and thermo-optic coefficient (dn/dT) at temperatures ranging from 25 to 300 K at wavelengths from 0.4 to 5.6 pm, while for Infrasil, we cover temperatures ranging from 35 to 300 K and wavelengths from 0.4 to 3.6 pm. For CaF2, we compare our index measurements to measurements of other investigators. For Infrasil, we compare our measurements to the mate~al manufacturer's data at room temperature and to cryogenic measurements for fused silica from previous investigations including one of our own. Finally, we provide temperature-dependent Sellmeier coefficients based on our measured data to allow accurate interpolation of index to other wavelengths and temperatures.

Leviton, Douglas B.↗

NASA NTRS2006

Temperature-dependent Refractive Index of Silicon and Germanium

Silicon and germanium are perhaps the two most well-understood semiconductor materials in the context of solid state device technologies and more recently micromachining and nanotechnology. Meanwhile, these two materials are also important in the field of infrared lens design. Optical instruments designed for the wavelength range where these two materials are transmissive achieve best performance when cooled to cryogenic temperatures to enhance signal from the scene over instrument background radiation. In order to enable high quality lens designs using silicon and germanium at cryogenic temperatures, we have measured the absolute refractive index of multiple prisms of these two materials using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, as a function of both wavelength and temperature. For silicon, we report absolute refractive index and thermo-optic coefficient (dn/dT) at temperatures ranging from 20 to 300 K at wavelengths from 1.1 to 5.6 pin, while for germanium, we cover temperatures ranging from 20 to 300 K and wavelengths from 1.9 to 5.5 microns. We compare our measurements with others in the literature and provide temperature-dependent Sellmeier coefficients based on our data to allow accurate interpolation of index to other wavelengths and temperatures. Citing the wide variety of values for the refractive indices of these two materials found in the literature, we reiterate the importance of measuring the refractive index of a sample from the same batch of raw material from which final optical components are cut when absolute accuracy greater than k5 x 10" is desired.

Frey, Bradley J.↗

NASA NTRS2004

Alignment and Performance of the Infrared Multi-Object Spectrometer

The Infrared Multi-Object Spectrometer (IRMOS) is a principle investigator class instrument for the Kitt Peak National Observatory 4 and 2.1 meter telescopes. IRMOS is a near-IR (0.8 - 2.5 micron) spectrometer with low-to mid-resolving power (R = 300 - 3000). IRMOS produces simultaneous spectra of approximately 100 objects in its 2.8 x 2.0 arc-min field of view (4 m telescope) using a commercial Micro Electro-Mechanical Systems (MEMS) micro-mirror array (MMA) from Texas Instruments. The IRMOS optical design consists of two imaging subsystems. The focal reducer images the focal plane of the telescope onto the MMA field stop, and the spectrograph images the MMA onto the detector. We describe ambient breadboard subsystem alignment and imaging performance of each stage independently, and ambient imaging performance of the fully assembled instrument. Interferometric measurements of subsystem wavefront error serve as a qualitative alignment guide, and are accomplished using a commercial, modified Twyman-Green laser unequal path interferometer. Image testing provides verification of the optomechanical alignment method and a measurement of near-angle scattered light due to mirror small-scale surface error. Image testing is performed at multiple field points. A mercury-argon pencil lamp provides a spectral line at 546.1 nanometers, a blackbody source provides a line at 1550 nanometers, and a CCD camera and IR camera are used as detectors. We use commercial optical modeling software to predict the point-spread function and its effect on instrument slit transmission and resolution. Our breadboard and instrument level test results validate this prediction. We conclude with an instrument performance prediction for cryogenic operation and first light in late 2003.

Connelly, Joseph A.↗

NASA NTRS2003

Integration, Testing and Performance of the Infrared Multi-Object Spectrometer

The Infrared Multi-Object Spectrometer (IRMOS) is a principle investigator-class instrument for the Kitt Peak National Observatory 2.1 m and Mayall 3.8 m telescopes. IRMOS is a near-IR (0.8 - 2.5 micron) spectrometer with low-to mid-resolving power (R = lambda/delta lambda = 300 - 3000). On the 3.8 m telescope, IRMOS produces simultaneous spectra of approximately 100 objects in its approximately 3 x 2 arcmin field of view using a commercial micro electro-mechanical systems (MEMS) digital micro-mirror device (DMD) from Texas Instruments. The multi-mirror array DMD operates as a real-time programmable slit mask. The all-reflective optical design consists of two imaging subsystems. The focal reducer images the focal plane of the telescope onto the DMD field stop, and the spectrograph images the DMD onto a large-format detector. The instrument operates at approximately 80 K, cooled by a single electro-mechanical cryocooler. The bench and all components are made from aluminum 6061-T651. There are three cryogenic mechanisms. We describe laboratory integration and test of IRMOS before shipment to Kitt Peak. We give an overview of the optical alignment technique and integration of optical, mechanical, electrical and cryogenic subsystems. We compare optical test results to model predictions of point spread function size and morphology, contrast, and stray light. We discuss some lessons learned and conclude with a prediction for performance on the telescope.

Ohl, Raymond G.↗

NASA NTRS1998

Far Ultraviolet Refractive Index of Optical Materials for Solar Blind Channel (SBC) Filters for HST Advanced Camera for Surveys

Refractive index measurements using the minimum deviation method have been carried out for prisms of a variety of far ultraviolet optical materials used in the manufacture of Solar Blind Channel (SBC) filters for the HST Advanced Camera for Surveys (ACS). Some of the materials measured are gaining popularity in a variety of high technology applications including high power excimer lasers and advanced microlithography optics operating in a wavelength region where high quality knowledge of optical material properties is sparse. Our measurements are of unusually high accuracy and precision for this wavelength region owing to advanced instrumentation in the large vacuum chamber of the Diffraction Grating Evaluation Facility (DGEF) at Goddard Space Flight Center (GSFC). Index values for CaF2, BaF2, LiF, and far ultraviolet grades of synthetic sapphire and synthetic fused silica are reported and compared with values from the literature.

Leviton, Douglas B.↗

NASA NTRS1998

Simple Refractometers for Index Measurements by Minimum Deviation Method from Far-ultraviolet to Near Infrared

The focal shift of an optical filter used in non-collimated light depends directly on substrate thickness and index of refraction. The HST Advanced Camera for Surveys (ACS) requires a set of filters whose focal shifts are tightly matched. Knowing the index of refraction for substrate glasses allows precise substrate thicknesses to be specified. Two refractometers have been developed at the Goddard Space Flight Center (GSFC) to determine the indices of refraction of materials from which ACS filters are made. Modem imaging detectors for the near infrared, visible, and far ultraviolet spectral regions make these simple yet sophisticated refractometers possible. A new technology, high accuracy, angular encoder also developed at GSFC makes high precision index measurement possible in the vacuum ultraviolet.

Leviton, Douglas B.↗