Search for a dark photon in electroproduced e + e − pairs with the Heavy Photon Search experiment at JLab
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72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
Engineering topics
McCarty, K.
Publications and source records attributed to McCarty, K..
The HPS electromagnetic calorimeter
The Heavy Photon Search experiment (HPS) is searching for a new gauge boson, the so-called "heavy photon". Through its kinetic mixing with the Standard Model photon, this particle could decay into an electron-positron pair. It would then be detectable as a narrow peak in the invariant mass spectrum of such pairs, or, depending on its lifetime, by a decay downstream of the production target. The HPS experiment is installed in Hall-B of Jefferson Lab. This article presents the design and performance of one of the two detectors of the experiment, the electromagnetic calorimeter, during the runs performed in 2015-2016. The calorimeter's main purpose is to provide a fast trigger and reduce the copious background from electromagnetic processes through matching with a tracking detector. Finally, the detector is a homogeneous calorimeter, made of 442 lead-tungsten (PbWO$_4$) scintillating crystals, each read-out by an avalanche photodiode coupled to a custom trans-impedance amplifier.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Integrated imaging sensor systems with CMOS active pixel sensor technology
This paper discusses common approaches to CMOS APS technology, as well as specific results on the five-wire programmable digital camera-on-a-chip developed at JPL. The paper also reports recent research in the design, operation, and performance of APS imagers for several imager applications.
double sampling↗
NSTAR Diagnostic Package (NDP) Architecture and Deep Space One (DS1) Spacecraft Event Detection
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DS1 NSTAR Diagnostic Package Event Detection↗
NSTAR Diagnostic Package (NDP) Architecture and Deep Space One (DS1) Spacecraft Event Detection
The NDP measures contamination, plasma characteristics, electrical fields, and magnetic fields. This paper describes the NDP requirements, development process, and flight systems functionality.
DS1 NSTAR Diagnostic Package↗
A Single-Chip Programmable Digital CMOS Imager with Enhanced Low Light Detection Capability
Low-power, low-cost, miniature and integrated digital imaging systems are expected to be widely used in consumer electronics in the near future. While CMOS technology has been responsible for the phenomenal growth in consumer electronics, micro-porcessors, memory, audio systems, and radio-frequency circuits (e.g. cellular phones), till recently, the video technology remained outside this mainstream.
digital↗
Ion Propulsion Subsystem Environmental Effects on Deep Space 1: Initial Results from the IPS Diagnostics Subsystem
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Ion Propulsion Diagnostic Sensors Electrostatic Fi↗
Ion Propulsion Subsystem Environmental Effects on DS1: Initial Results from the IPS Diagnostics Subsystem
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Ion Propulsion Diagnostic Sensors Electrostatic Fi↗
Next Generation CMOS Active Pixel Sensors for Satellite Hybrid Optical Communications/Imaging Sensor Systems
Radiation hardened/tolerant Active Pixel Sensor CMOS imagers that can be adaptively windowed with low power, on-chip control, timing, digital output and provide data-channel efficient on-chip compression, high bandwidth optical communications links are being designed and investigated to reduce size, weight and cost for common optics/hybrid architectures.
APS↗
Observations of Single Event Failure in Power MOSFETS
The first compendium of single event test data for power MOSFETs provides failure thresholds from burnout or gate rupture for over 100 devices of eight manufacturers. Ordering the data has also provided some useful insights.
bipolar power transistors single event test burnou↗
Overview of Device SEE Susceptibility From Heavy Ions
This paper presents an evaluation of trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts.
single-event effects (SEE) heavy ion↗
Single Event Effects on Space Radiation Hardened 64K SRAMS at Room temperature
The laser threshold linear Energy transfer for single event upsetscan be estimaed, even at room temperature, for space radiation hardened 64K SRAMs. The memories where independently developed to quality for the Qualified Manufacturer's List by IBM and Honeywell. The memory was so hard that high energy heavy ions generated by the Van de Graff could not determine the SEU threshold at room temperature. Use of pulsed Laser tests would meake it possible to forgo very expensive testing at ultra-high energy accelerators.
Space Radiation 64K SRAMS↗