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McFadden, Neil Christopher

Publications and source records attributed to McFadden, Neil Christopher.

Understanding the enhancement of scintillation light in xenon-doped liquid argon

Measuring the scintillation light in noble gases is an important detection technique in particle physics. Numerous rare event searches like neutrino beam experiments, neutrino-less double beta-decay, and dark matter searches use argon-based detectors. In liquid argon, the light yield can be enhanced by the addition of a small quantity of xenon, where ~10–1000 ppm are added. The general enhancement mechanism and its pathway via an energy transfer between argon and xenon excimers is well known, however the importance of absorption of argon excimer emission by atomic xenon has not been fully appreciated. This absorption significantly reduces the light yield in commercially available argon (extracted from air) which contains trace amounts (~0.1 ppm) of xenon. The addition of a small xenon dopant of ~10 ppm recovers this lost light resulting in an increased light yield over un-doped argon of about a factor of two. Here, in this paper, we introduce a model for the light production in xenon doped argon, including absorption and re-emission, and compare it to the measured time dependence of light emission in xenon-doped argon.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Large-scale, precision xenon doping of liquid argon

The detection of scintillation light from liquid argon is an experimental technique key to a number of current and future nuclear/particle physics experiments, such as neutrino physics, neutrinoless double beta decay and dark matter searches. Additionally, although the idea of adding small quantities of xenon (doping) to enhance the light yield has attracted considerable interest, this technique has never been demonstrated at the necessary scale or precision. Here we report on xenon doping in a 100 l cryogenic vessel. Xenon doping was performed in four concentrations of 1.00 ± 0.06 ppm, 2.0 ± 0.1 ppm, 5.0 ± 0.3 ppm, and 10.0 ± 0.5 ppm. These measurements represent the most precise xenon doping measurements as of publishing. We observed an increase in average light yield by a factor of 1.92 ± 0.12(syst) ± 0.02(stat) at a dopant concentration of 10 ppm.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗