Engineering topics
Publications and source records attributed to McGuckin, B. T..
Light reflected from Spectralon, the material chosen for on-board radiometric calibration of the Multi-angle Imaging SpectroRadiometer (MISR) is quantified in terms of the fraction of the reflected intensity that has the same polarization as the incident light.
The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.
A precision reflectance characterization facility, constructed.
The reflectance properties of an engineering model of the Spectralon panel intended for use within an On-Board Calibrator (OBC) on the NASA Multi-angle Imaging SpectroRadiometer (MISR) instrument have been fully characterized with regard to panel uniformity and isotropy in response to three incident laser wavelengths of 442, 632.8 and 859.9 nm. A regional variation in bidirectional reflectance function (BRF) across the surface of the engineering model (EM) panel, contributing to spatial non-uniformity at the +/-2% level has been measured at all three laser wavelengths. Further, a BRF anisotropy has been identified. The mechanism causing these departures from the ideal Lambertian surface may originate in the sanding of the Spectralon surface in the final stage of preparation. This is corroborated by measurements made on a 'pressed' polytetrafluoroethylene (PTFE) panel in which a greatly reduced anisotropy in panel BRF is measured. The EM panel BRF reveals deviation from a Lambertian characteristic manifest as an off-specular peak in the forward scattering direction. A common cross-over point at an angle of reflection of around 37 at which the BRF is constant within 0.4% for an illumination angle range of ui = 30 60 is observed at all three wavelengths. Two Spectralon protoflight panels which were fabricated after the engineering model was studied were also the subject of a uniformity study over part of the area of the Spectralon panels at the 442 nm wavelength. The analysis indicated that the panel uniformity satisfies the 0.5% criterion indicating improved panel preparation. However, the off specular peak in the forward scattering direction is essentially unchanged with the cross-over point at approximately 37.
Optical heterodyne experiments involving the photomixing of two single frequency, deode-pumped thulium holmium yttrium lithium flouride lasers are described. Operated in external frquency stabilization loops, the lasers exhibit 1MHz short term stability, and are photomixed and offset-locked at 140 MHz. Summation of sine wave modulation onto the PZT control voltage on one laser results in frequency swept operation over a continuous tuning range of 160 MHz.