Engineering topics

Mcneil, J. A.

Publications and source records attributed to Mcneil, J. A..

3 records

NASA NTRS1985

Programable Driver for Voltage-Controlled Oscillators

Electronically programable read-only memory (EPROM) and digital-to-analog converter provide customized time-varying voltage for frequency modulation. Voltage used to modulate IMPATT oscillator that serves as microwave pump for solid-state maser in low-noise amplifier. EPROM simple to tailor voltage waveform to suit characteristics of given maser. Digital information for waveform programed into EPROM chip; digital-to-analog converter reads information and produces corresponding analog wave. Principle readily adapted to other applications.

Fowler, L. E.↗

NASA NTRS1983

An EPROM-based function generator

A circuit is described to produce arbitrary time-dependent voltage functions derived from digital information stored in EPROMs. While this circuit is designed to be used as a modulator of the microwave pump source or a solid state low noise maser, it can be readily adapted for other applications.

Fowler, L.↗

NASA NTRS1981

Traveling-wave maser, closed cycle refrigerator automation

At the present time all traveling-wave maser and closed-cycle refrigerator system (TWM-CCR) and their power supply and helium compressor assemblies are operated manually. Many man-hours are required of highly trained and experienced operators, resulting in high operator cost. Of greater importance are the problems of unpredictable failure and long downtimes. Since field performance is not monitored, system degradation is detected only when it has progressed to the point of catastrophic failure. Without the aid of performance histories, failure diagnosis is arduous and slow. Rational and functional requirements for the TWM-CCR Automation project are the following: (1) to improve reliability and reduce downtime by providing unattended monitor and control, alarm and fault location, failure prediction and self-corrective action; (2) to reduce operator cost by providing automatic tuning and cooldown procedures; and (3) to improve system operations and development by providing the needed engineering data.

Mcneil, J. A.↗