Search NASA⌕ Search

Engineering topics

Medina Peregrina, M.

Publications and source records attributed to Medina Peregrina, M..

Overcoming photobleaching in imaging of single barium atoms in a solid xenon matrix

Neutrinoless double beta decay is one of the most sensitive probes for new physics beyond the Standard Model of particle physics. One of the isotopes under investigation is 136 Xe, which would double beta decay into 136 Ba. Detecting the single 136 Ba daughter provides a sort of ultimate tool in the discrimination against backgrounds. Previous work demonstrated the ability to perform single atom imaging of Ba atoms in a single-vacancy site of a solid xenon matrix. In this paper, the effort to identify signal from individual barium atoms is extended to Ba atoms in a hexa-vacancy site in the matrix and is achieved despite increased photobleaching in this site. Abrupt fluorescence turn-off of a single Ba atom is also observed. Significant recovery of fluorescence signal lost through photobleaching is demonstrated upon annealing of Ba deposits in the Xe ice. Following annealing, it is observed that Ba atoms in the hexa-vacancy site exhibit antibleaching while Ba atoms in the tetra-vacancy site exhibit bleaching. This may be evidence for a matrix site transfer upon laser excitation. Our findings offer a path of continued research toward tagging of Ba daughters in all significant sites in solid xenon.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Development of a 127 Xe calibration source for nEXO

Here, we study a possible calibration technique for the nEXO experiment using a 127 Xe electron capture source. nEXO is a next-generation search for neutrinoless double beta decay (0νββ) that will use a 5-tonne, monolithic liquid xenon time projection chamber (TPC). The xenon, used both as source and detection medium, will be enriched to 90% in 136 Xe. To optimize the event reconstruction and energy resolution, calibrations are needed to map the position- and time-dependent detector response. The 36.3 day half-life of 127 Xe and its small Q-value compared to that of 136 Xe 0νββ would allow a small activity to be maintained continuously in the detector during normal operations without introducing additional backgrounds, thereby enabling in-situ calibration and monitoring of the detector response. In this work we describe a process for producing the source and preliminary experimental tests. We then use simulations to project the precision with which such a source could calibrate spatial corrections to the light and charge response of the nEXO TPC.

47 OTHER INSTRUMENTATION↗

Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon

Silicon photomultipliers are regarded as a very promising technology for next-generation, cutting-edge detectors for low-background experiments in particle physics. This work presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of Münster has been used that allows to acquire angle-resolved reflection measurements of various samples immersed in liquid xenon with 0.45° angular resolution. Four samples are investigated in this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and one Large-Area Avalanche Photodiode (LA-APD) from EXO-200. Here, the reflectivity is determined to be 25–36 % at an angle of incidence of 20° for the four samples and increases to up to 65 % at 70° for the LA-APD and the FBK samples. The Hamamatsu VUV4 SiPM shows a decline with increasing angle of incidence. The reflectivity results will be incorporated in upcoming light response simulations of the nEXO detector.

(pin diodes, APDs, SiPMs, G-APDs, CCDs, EBCCDs, EM↗