Errors in retarding potential analyzers caused by nonuniformity of the grid-plane potential.
One aspect of the degradation in performance of retarding potential analyzers caused by potential depressions in the retarding grid is quantitatively estimated from laboratory measurements and theoretical calculations. A simple expression is obtained that permits the use of laboratory measurements of grid properties to make first-order corrections to flight data. Systematic positive errors in ion temperature of approximately 16% for the Ogo 4 instrument and 3% for the Ogo 6 instrument are deduced. The effects of the transverse electric fields arising from the grid potential depressions are not treated.
Hanson, W. B.↗