Engineering topics
Publications and source records attributed to Miller, M. K..
GaN/ZnGeN 2 /GaN double heterojunctions were grown by molecular beam epitaxy; we demonstrate coherent interfaces between ZnGeN 2 and GaN and highlight defects and associated properties of interest with respect to optoelectronic applications.
We have successfully fabricated atom probe samples of a metamorphic magnetite and performed an analysis of one of these samples using a local electrode atom probe (LEAP).
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Magnetite has been analysed using Field Ion Microscopy (FIM) and Atom Probe Tomography (APT), highly attractive techniques for the nanoanalysis of geological materials despite the difficulties inherent in analyzing semiconducting and insulating materials. Additional information is contained in the original extended abstract.
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A combined atom probe field ion microscopy and analytical electron microscopy characterization has been performed on laboratory aged martensitic and austenitic specimens of FeNi and FeNiP alloys. These techniques revealed that the martensitic 24.1 and 28.6 at.% Ni alloys decomposed during aging for 1 year at 300 C to form face centered cubic precipitates of approx. 56 at.% Ni in a body centered cubic matrix containing approx. 20 at.% Ni. Some thin platelets were observed in the field ion micrographs of the austenitic Fe-42.9 at. % Ni alloy and the Fe-43.2 at.% Ni-0.44 at.% P alloy after aging at 400 and 350 C. Atom probe analysis revealed phosphorus clustering in the ternary alloy aged at 300 C.