Search NASA⌕ Search

Engineering topics

Mon, G. R.

Publications and source records attributed to Mon, G. R..

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1997

Inconsistencies in the Understanding of Solder Joint Reliability Physics

Over the years, many analytical and experimental research studies have aimed to improve the state-of-the-art assessment of solder joint integrity from a physics-of-failure perspective. Although much progress has been made, there still exist many inconsistent and even contradictory correlations and conclusions. Before discussing some of the prominent inconsistencies found in the literature, this paper reviews the fundamental physics underlying the nature of solder failure...Using the complex constitutive properties of solder, fundamental mechanical and thermomechanical proccesses can be modeled to demonstrate some of the inconsistencies in the literature.

solder joints solder solder joint failure joint fa↗
NASA NTRS1992

Spacecraft Cooler Characterization

To meet an important need within the space community for a reliable and accurate database of cryocooler performance, the Jet Propulsion Laboratory (JPL), under SDIO/Air Force Sponsorship, is conducting an extensive space cryocooler characterization program involving long-life cryocoolers submitted by world-wide manufacturers.

cryocoolers↗
NASA NTRS1992

Solder creep-fatigue interactions with flexible leaded parts

With flexible leaded parts, the solder-joint failure process involves a complex interplay of creep and fatigue mechanisms. To better understand the role of creep in typical multi-hour cyclic loading conditions, a specialized non-linear finite-element creep simulation computer program has been formulated. The numerical algorithm includes the complete part-lead-solder-PWB system, accounting for strain-rate dependence of creep on applied stress and temperature, and the role of the part-lead dimensions and flexibility that determine the total creep deflection (solder strain range) during stress relaxation. The computer program has been used to explore the effects of various solder creep-fatigue parameters such as lead height and stiffness, thermal-cycle test profile, and part/board differential thermal expansion properties. One of the most interesting findings is the strong presence of unidirectional creep-ratcheting that occurs during thermal cycling due to temperature dominated strain-rate effects. To corroborate the solder fatigue model predictions, a number of carefully controlled thermal-cycle tests have been conducted using special bimetallic test boards.

Ross, R. G., Jr.↗
NASA NTRS1988

Electrical isolation design and electrochemical corrosion in thin-film photovoltaic modules

The development of a proposed wet insulation-resistance qualification test specification for production-line modules is presented. Laboratory research directed toward understanding and eliminating problems associated with electrical isolation of thin-film photovoltaic module circuitry is presented. Test results serve to measure module field life as limited by electrochemical corrosion degradation mechanisms. Current module-level research covering encapsulant voltage withstand capability is also described, and suggestions for improving module electrical isolation are offered.

Sugimura, R. S.↗
NASA NTRS1987

Corrosion of a-Si cells and modules

The authors report on corrosion/erosion phonemena observed in exposing a-Si cells, modules, and specially designed test structures to natural and accelerated test environments. Relevant cell and module I-V curve data used for monitoring degradation are presented. The causes of the observed degradation, methods of mitigation, and consequences for fielded modules are discussed.

Mon, G. R.↗
NASA NTRS1986

Electrochemical aging effects in photovoltaic modules

Leakage currents were experimentally measured in PV modules undergoing natural aging outdoors, and in PV modules undergoing accelerated aging in laboratory environmental chambers. The significant contributors to module leakage current were identified with a long range goal to develop techniques to reduce or stop module leakage currents. For outdoor aging in general, module leakage current is relatively insensitive to temperature fluctuations, but is very sensitive to moisture effects such as dew, precipitation, and fluctuations in relative humidity. Comparing ethylene vinyl acetate (EVA) and polyvinyl butyral (PVB), module leakage currents are much higher in PVB as compared to EVA for all environmental conditions investigated. Leakage currents proceed in series along two paths, bulk conduction followed by interfacial (surfaces) conduction.

Mon, G. R.↗
NASA NTRS1985

Module voltage isolation and corrosion research

A summary of recent research at JPL on two topics related to achieving long term reliability of photovoltaic modules: voltage isolation and electrochemical corrosion is presented. Special emphasis is given to similarities and differences in performance between crystalline silicon modules and amorphous silicon modules.

Mon, G. R.↗
NASA NTRS1985

Moisture-temperature degradation in module encapsulants: The general problem of moisture in photovoltaic encapsulants

A general research approach was outlined toward understanding water-module interactions and the influence of temperature involving the need to: quantify module performance loss versus level of accumulated degradation, establish the dependence of the degradation reaction rate on module moisture and temperature levels, and determine module moisture and temperature levels in field environments. These elements were illustrated with examples drawn from studies of the now relatively well understood module electrochemical degradation process. Research data presented include temperature and humidity-dependent equilibrium leakage current values for multiparameter module material and design configurations. The contributions of surface, volume, and interfacial conductivities was demonstrated. Research directions were suggested to more fully understand the contributions to overall module conductivity of surface, volume, and interfacial conductivities over ranges of temperature and relative humidity characteristic of field environments.

Mon, G. R.↗
NASA NTRS1985

Predicting the Reliability of Solar-Cell Interconnections

The reduction of life expectancy by thermal cycling calculated during design. Connections between solar cells critical parts of solarcell arrays generating electric power. Reliability affects life expectancy of modules, panels, and arrays. Used to predict stress-cycle lifetimes of such structures as arches, walkways, cylindrical ribbing of aircraft fuselages and submarine hulls, and pipeline expansion loops. Testing costs reduced by about 90 percent.

Mon, G. R.↗
NASA NTRS1985

Electrochemical degradation of amorphous-silicon photovoltaic modules

Techniques of module electrochemical corrosion research, developed during reliability studies of crystalline-silicon modules (C-Si), have been applied to this new investigation into amorphous-silicon (a-Si) module reliability. Amorphous-Si cells, encapsulated in the polymers polyvinyl butyral (PVB) and ethylene vinyl acetate (EVA), were exposed for more than 1200 hours in a controlled 85 C/85 percent RH environment, with a constant 500 volts applied between the cells and an aluminum frame. Plotting power output reduction versus charge transferred reveals that about 50 percent a-Si cell failures can be expected with the passage of 0.1 to 1.0 Coulomb/cm of cell-frame edge length; this threshold is somewhat less than that determined for C-Si modules.

Mon, G. R.↗
NASA NTRS1984

Solar-cell interconnect design for terrestrial photovoltaic modules

Useful solar cell interconnect reliability design and life prediction algorithms are presented, together with experimental data indicating that the classical strain cycle (fatigue) curve for the interconnect material does not account for the statistical scatter that is required in reliability predictions. This shortcoming is presently addressed by fitting a functional form to experimental cumulative interconnect failure rate data, which thereby yields statistical fatigue curves enabling not only the prediction of cumulative interconnect failures during the design life of an array field, but also the quantitative interpretation of data from accelerated thermal cycling tests. Optimal interconnect cost reliability design algorithms are also derived which may allow the minimization of energy cost over the design life of the array field.

Mon, G. R.↗
NASA NTRS1984

Topics in electrochemical degradation of photovoltaic modules

Electrochemical degradation of photovoltaic modules was examined. It is found that the extent of electrochemical damage is dependent on the integrated leakage current. The PV electrochemical degradation mechanisms in the two polarities are different: (1) degradation rates in the two polarities are of the same order of magnitude; (2) center tapped grounded arrays are a preferred system configuration to minimize electrochemical degradation. The use of thicker pottant layers and polymer substrate films to reduce equilibrium leakage current values is suggested. A metallized substrate layer, if used, should be isolated from the pottant and the frame by polyester layers, and EVA modules appear to be consistent with 30 year life allocation levels for electrochemical damage. Temperature acceleration factors are well behaved and moderately well understood; humidity acceleration factors vary radically with module construction and materials and require additional research.

Mon, G. R.↗
NASA NTRS1984

Predicting electrochemical breakdown in terrestrial photovoltaic modules

Electrochemical corrosion of PV cells can cause a cell-to-frame short circuit with two undesirable resuits: (1) catastrophic loss of source-circuit power; and (2) high field maintenance (module replacement) costs. Parameter dependencies are determined and encapsulated two-cell coupons are exposed to a range of voltage differences, temperatures, and relative humidities. Material relative performance is assessed. Nine different metallization-encapsulation combinations are tested.

Mon, G. R.↗
NASA NTRS1983

Observations of solar-cell metallization corrosion

The Engineering Sciences Area of the Jet Propulsion Laboratory (JPL) Flat-Plate Solar Array Project is performing long term environmental tests on photovoltaic modules at Wyle Laboratories in Huntsville, Alabama. Some modules have been exposed to 85 C/85% RH and 40 C/93% RH for up to 280 days. Other modules undergoing temperature-only exposures ( 3% RH) at 85 C and 100 C have been tested for more than 180 days. At least two modules of each design type are exposed to each environment - one with, and the other without a 100-mA forward bias. Degradation is both visually observed and electrically monitored. Visual observations of changes in appearance are recorded at each inspection time. Significant visual observations relating to metallization corrosion (and/or metallization-induced corrosion) include discoloration (yellowing and browning) of grid lines, migration of grid line material into the encapsulation (blossoming), the appearance of rainbow-like diffraction patterns on the grid lines, and brown spots on collectors and grid lines. All of these observations were recorded for electrically biased modules in the 280-day tests with humidity.

Mon, G. R.↗