Total Ionizing Dose Test Report for the AD9364 RF Transceiver
This is a Total Ionizing Dose (TID) test report for the Analog Devices AD9364 RF Transceiver.
complementary metal oxide semiconductor (CMOS)↗
Engineering topics
Mondy, Tim
Publications and source records attributed to Mondy, Tim.
Heavy Ion Test Report for the AD9364 RF Transceiver
The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibility of the AD9364 from Analog Devices.
single event function interrupt (SEFI)↗