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Nagayama, Taisuke

Publications and source records attributed to Nagayama, Taisuke.

At least 19 records

Milestone 7720: National Opacity Program - Tri-Lab Assessment of Measurements and Models

Opacity-on-NIF has obtained opacity data under conditions similar to those achieved by the entirely different Opacity-on-Z platform. From low- and high-Z elements at different anchor points, rigorously compare the opacity data between the laboratories and to multiple opacity theory models. Compare and assess the data acquisition and processing methods for obtaining opacities and for measuring/inferring sample conditions. Explain, or develop hypotheses for, any discrepancies. Map progress to the National Opacity Strategy and define future directions.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Developing and applying quantifiable metrics for diagnostic and experiment design on Z

This project applies methods in Bayesian inference and modern statistical methods to quantify the value of new experimental data, in the form of new or modified diagnostic configurations and/or experiment designs. We demonstrate experiment design methods that can be used to identify the highest priority diagnostic improvements or experimental data to obtain in order to reduce uncertainties on critical inferred experimental quantities and select the best course of action to distinguish between competing physical models. Bayesian statistics and information theory provide the foundation for developing the necessary metrics, using two high impact experimental platforms on Z as exemplars to develop and illustrate the technique. We emphasize that the general methodology is extensible to new diagnostics (provided synthetic models are available), as well as additional platforms. We also discuss initial scoping of additional applications that began development in the last year of this LDRD.

97 MATHEMATICS AND COMPUTING↗

A generalized approach to x-ray data modeling for high-energy-density plasma experiments

Accurate understanding of x-ray diagnostics is crucial for both interpreting high-energy-density experiments and testing simulations through quantitative comparisons. X-ray diagnostic models are complex. Past treatments of individual x-ray diagnostics on a case-by-case basis have hindered universal diagnostic understanding. Here, in this study, we derive a general formula for modeling the absolute response of non-focusing x-ray diagnostics, such as x-ray imagers, one-dimensional space-resolved spectrometers, and x-ray power diagnostics. The present model is useful for both data modeling and data processing. It naturally accounts for the x-ray crystal broadening. The new model verifies that standard approaches for a crystal response can be good approximations, but they can underestimate the total reflectivity and overestimate spectral resolving power by more than a factor of 2 in some cases near reflectivity edge features. We also find that a frequently used, simplified-crystal-response approximation for processing spectral data can introduce an absolute error of more than an order of magnitude and the relative spectral radiance error of a factor of 3. The present model is derived with straightforward geometric arguments. It is more general and is recommended for developing a unified picture and providing consistent treatment over multiple x-ray diagnostics. Such consistency is crucial for reliable multi-objective data analyses.

Nagayama, Taisuke↗