Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures
The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd 1-x Mg x Te barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd 1-x Mg x Te layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd 1-x Mg x Te double heterostructures is discussed. Furthermore, the stability of CdTe/Cd 1-x Mg x Te heterostructures are investigated with respect to thermal processing.