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Nusair, O.

Publications and source records attributed to Nusair, O..

Search for two-neutrino double-beta decay of 136 Xe to the $0$$^{+}_{1}$ excited state of 136 Ba with the complete EXO-200 dataset*

A new search for two-neutrino double-beta (2νββ) decay of 136 Xe to the $0$$^{+}_{1}$ excited state of 136 Ba is performed with the full EXO-200 dataset. A deep learning-based convolutional neural network is used to discriminate signal from background events. Signal detection efficiency is increased relative to previous searches by EXO-200 by more than a factor of two. With the addition of the Phase II dataset taken with an upgraded detector, the median 90% confidence level half-life sensitivity of 2νββ decay to the $0$$^{+}_{1}$ state of 136 Ba is 2.9 x 10 24 yr using a total 136 Xe exposure of 234.1 kg yr. Furthermore, no statistically significant evidence for 2νββ decay to the $0$$^{+}_{1}$ state is observed, leading to a lower limit of $T$$^{2v}_{1/2}$(0 + → $0$$^{+}_{1}$) > 1.4 x 10 24 yr at 90% confidence level, improved by 70% relative to the current world's best constraint.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Generative adversarial networks for scintillation signal simulation in EXO-200

Generative Adversarial Networks trained on samples of simulated or actual events have been proposed as a way of generating large simulated datasets at a reduced computational cost. In this work, a novel approach to perform the simulation of photodetector signals from the time projection chamber of the EXO-200 experiment is demonstrated. The method is based on a Wasserstein Generative Adversarial Network — a deep learning technique allowing for implicit non-parametric estimation of the population distribution for a given set of objects. Our network is trained on real calibration data using raw scintillation waveforms as input. We find that it is able to produce high-quality simulated waveforms an order of magnitude faster than the traditional simulation approach and, importantly, generalize from the training sample and discern salient high-level features of the data. In particular, the network correctly deduces position dependency of scintillation light response in the detector and correctly recognizes dead photodetector channels. Furthermore, the network output is then integrated into the EXO-200 analysis framework to show that the standard EXO-200 reconstruction routine processes the simulated waveforms to produce energy distributions comparable to that of real waveforms. Finally, the remaining discrepancies and potential ways to improve the approach further are highlighted.

47 OTHER INSTRUMENTATION↗

Comprehensive study of radon progeny attachment to surfaces

Low energy, low rate experiments, such as searches for neutrinoless double β decay and dark matter, require unprecedentedly low levels of background in order to deliver their full science potential. 210 Po driven, neutron induced background, caused by nuclear (α, n) reactions on low-Z materials, direct background contributions of the 210 Po α radiation and desorption of the 210 Pb progeny 210 Bi from surfaces into the detector medium are of particular of concern. These backgrounds depend on details of the components’ exposure to radon-loaded laboratory air and, thus, their handling history. The attachment rates of airborne radon progeny to surfaces, needed for the estimation of these background rates, are poorly understood. This article reports the results of a campaign comprising of more than 1200 attachment measurements, performed for nine different materials. Correlations of the attachment with environmental parameters such as air exchange rate, electrical surface potential, temperature, atmospheric pressure, and relative humidity have been studied and found to be significant only in case of the first two. Attachment modeling, using the Jacobi model, is compared to data.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Search for MeV electron recoils from dark matter in EXO-200

We present a search for electron-recoil signatures from the charged-current absorption of fermionic dark matter using the EXO-200 detector. We report an average electron-recoil background rate of 6.8×10 4 ⁢cts ⁢kg −1 yr −1 keV −1 above 4 MeV and find no statistically significant excess over our background projection. Using a total 136 Xe exposure of 234.1 kg yr, we exclude new parameter space for the charged-current absorption cross section for dark matter masses between 𝑚𝜒=2.6–11.6 MeV with a minimum of 6×10 −51 cm 2 at 8.3 MeV at the 90% confidence level.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

nEXO: neutrinoless double beta decay search beyond 10 28 year half-life sensitivity

The nEXO neutrinoless double beta (0νββ) decay experiment is designed to use a time projection chamber and 5000 kg of isotopically enriched liquid xenon to search for the decay in 136 Xe. Progress in the detector design, paired with higher fidelity in its simulation and an advanced data analysis, based on the one used for the final results of EXO-200, produce a sensitivity prediction that exceeds the half-life of 10 28 years. Specifically, improvements have been made in the understanding of production of scintillation photons and charge as well as of their transport and reconstruction in the detector. The more detailed knowledge of the detector construction has been paired with more assays for trace radioactivity in different materials. In particular, the use of custom electroformed copper is now incorporated in the design, leading to a substantial reduction in backgrounds from the intrinsic radioactivity of detector materials. Furthermore, a number of assumptions from previous sensitivity projections have gained further support from interim work validating the nEXO experiment concept. Together these improvements and updates suggest that the nEXO experiment will reach a half-life sensitivity of 1.35 × 10 28 yr at 90% confidence level in 10 years of data taking, covering the parameter space associated with the inverted neutrino mass ordering, along with a significant portion of the parameter space for the normal ordering scenario, for almost all nuclear matrix elements. Furthermore, the effects of backgrounds deviating from the nominal values used for the projections are also illustrated, concluding that the nEXO design is robust against a number of imperfections of the model.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Sensitivity analysis towards trace-uranium detection with γ-γ coincidence NAA

An improved approach for detection of trace amounts of 238 U by means of neutron activation analysis (NAA) is presented. The analysis enhancement is obtained by utilizing γ-γ coincidence counting. An empirical method for evaluating the sensitivity gain in the presence of a large source-related background is presented. A comparison of detection limits is made between two counting schemes; namely, counting single gammas using one HPGe detector versus counting coincident gammas using two HPGe detectors placed face-to-face. Furthermore, a data-validated radiation transport model, created in GEANT4 for a single HPGe detector, is extended to handle the two detector setup. In this counting scheme, a 238 U-detection sensitivity enhancement of about a factor of 8 is predicted for a sample of Saint-Gobain G3 Sapphire when compared to the simpler singles counting approach.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon

Silicon photomultipliers are regarded as a very promising technology for next-generation, cutting-edge detectors for low-background experiments in particle physics. This work presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of Münster has been used that allows to acquire angle-resolved reflection measurements of various samples immersed in liquid xenon with 0.45° angular resolution. Four samples are investigated in this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and one Large-Area Avalanche Photodiode (LA-APD) from EXO-200. Here, the reflectivity is determined to be 25–36 % at an angle of incidence of 20° for the four samples and increases to up to 65 % at 70° for the LA-APD and the FBK samples. The Hamamatsu VUV4 SiPM shows a decline with increasing angle of incidence. The reflectivity results will be incorporated in upcoming light response simulations of the nEXO detector.

(pin diodes, APDs, SiPMs, G-APDs, CCDs, EBCCDs, EM↗

Event reconstruction in a liquid xenon Time Projection Chamber with an optically-open field cage

nEXO is a proposed tonne-scale neutrinoless double beta decay (0νββ) experiment using liquid 136 Xe (LXe) in a Time Projection Chamber (TPC) to read out ionization and scintillation signals. Between the field cage and the LXe vessel, a layer of LXe (“skin” LXe) is present, where no ionization signal is collected. Only scintillation photons are detected, owing to the lack of optical barrier around the field cage. Here, in this work, we show that the light originating in the skin LXe region can be used to improve background discrimination by 5% over previous published estimates. This improvement comes from two elements. First, a fraction of the γ-ray background is removed by identifying light from interactions with an energy deposition in the skin LXe. Then, background from 222 Rn dissolved in the skin LXe can be efficiently rejected by tagging the α decay in the 214 Bi- 214 Po chain in the skin LXe.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths

Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. In this work, we report the angular dependence of the specular reflectance in vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu Photonics K.K. (HPK) over wavelengths ranging from 120 to 280 nm. Refractive index and extinction coefficient of the thin silicon-dioxide film deposited on the surface of the FBK SiPMs are derived from reflectance data of an FBK silicon wafer with the same deposited oxide film as SiPMs. The diffuse reflectance of SiPMs is also measured at 193 nm. We use the VUV spectral dependence of the optical constants to predict the reflectance of the FBK silicon wafer and FBK SiPMs in liquid xenon.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗