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O'Dell, Stephen L.

Publications and source records attributed to O'Dell, Stephen L..

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2020

IXPE Mission System Concept and Development Status

The Goal of the Imaging X-Ray Polarimetry Explorer (IXPE) Mi SMEX), is to expand understanding of high-energy astrophysical processes and sources, in support of NASA’s first science objective in Astrophysics: “Discover how the universe works.” IXPE, an international collaboration, will conduct X-ray imaging polarimetry for multiple categories of cosmic X-ray sources such as neutron stars, stellar-mass black holes, supernova remnants and active galactic nuclei. The Observatory uses a single science operational mode capturing the X-ray data from the targets. The IXPE Observatory consists of spacecraft and payload modules built up in parallel to form the Observatory during system integration and test. The payload includes three X-ray telescopes each consisting of a polarization-sensitive, gas pixel X-ray detector, paired with its corresponding grazing incidence mirror module assembly (MMA). A deployable boom provides the correct separation (focal length) between the detector units (DU) and MMAs. These payload elements are supported by the IXPE spacecraft which is derived from the BCP-small spacecraft architecture. This paper summarizes the IXPE mission science objectives, updates the Observatory implementation concept including the payload and spacecraft ts and summarizes the mission status since last year’s conference.

Deininger, William D.↗
NASA NTRS2019

The Imaging X-Ray Polarimetry Explorer (IXPE): Technical Overview II

The Imaging X-ray Polarimetry Explorer (IXPE) will add polarization to the properties (time, energy, and position) observed in x-ray astronomy. A NASA Astrophysics Small Explorer (SMEX) in partnership with the Italian Space Agency (ASI), IXPE will measure the 2–8-keV polarization of a few dozen sources during the first 2 years following its 2021 launch. The IXPE Observatory includes three identical x-ray telescopes, each comprising a 4-m-focal-length (grazingincidence) mirror module assembly (MMA) and a polarization-sensitive (imaging) detector unit (DU), separated by a deployable optical bench. The Observatory’s Spacecraft provides typical subsystems (mechanical, structural, thermal, power, electrical, telecommunications, etc.), an attitude determination and control subsystem for 3-axis stabilized pointing, and a command and data handling subsystem communicating with the science instrument and the Spacecraft subsystems.

X-ray astronomy↗
NASA NTRS2018

The Imaging X-ray Polarimetry Explorer (IXPE): Technical Overview

The Imaging X-ray Polarimetry Explorer (IXPE) will expand the information space for study of cosmic sources, by adding linear polarization to the properties (time, energy, and position) observed in x-ray astronomy. Selected in 2017 January as a NASA Astrophysics Small Explorer (SMEX) mission, IXPE will be launched into an equatorial orbit in 2021. The IXPE mission will provide scientifically meaningful measurements of the x-ray polarization of a few dozen sources in the 2-8 keV band, including polarization maps of several x-ray-bright extended sources and phase-resolved polarimetry of many bright pulsating x-ray sources.

O'Dell, Stephen L.↗
NASA NTRS2018

Imaging X-Ray Polarimetry Explorer Mission Attitude Determination and Control Concept

The goal of the Imaging X-Ray Polarimetry Explorer (IXPE) Mission is to expand understanding of high-energy astrophysical processes and sources, in support of NASA's first science objective in Astrophysics: "Discover how the universe works." X-ray polarimetry is the focus of the IXPE science mission. Polarimetry uniquely probes physical anisotropies-ordered magnetic fields, aspheric matter distributions, or general relativistic coupling to black-hole spin-that are not otherwise measurable. The IXPE Observatory consists of Spacecraft and Payload modules. The Payload includes three polarization sensitive, X-ray detector units (DU), each paired with its corresponding grazing incidence mirror module assemblies (MMA). A deployable boom provides the correct separation (focal length) between the DUs and MMAs. These Payload elements are supported by the IXPE Spacecraft. A star tracker is mounted directly with the deployed Payload to minimize alignment errors between the star tracker line of sight (LoS) and Payload LoS. Stringent pointing requirements coupled with a flexible structure and a non-collocated attitude sensor-actuator configuration requires a thorough analysis of control-structure interactions. A non-minimum phase notch filter supports robust control loop stability margins. This paper summarizes the IXPE mission science objectives and Observatory concepts, and then it describes IXPE attitude determination and control implementation. IXPE LoS pointing accuracy, control loop stability, and angular momentum management are discussed.

Attitude Determination and Contro↗
NASA NTRS2017

Modeling Contamination Migration on the Chandra X-Ray Observatory - IV

During its first 18 years of operation, the cold (about -60degC) optical blocking filters of the Advanced CCD Imaging Spectrometer (ACIS), aboard the Chandra X-ray Observatory, has accumulated a growing layer of molecular contamination, which attenuates low-energy x rays. Over the past several years, the accumulation rate, spatial distribution, and composition have changed. This evolution has motivated further analysis of contamination migration within and near the ACIS cavity, in part to evaluate potential bake-out scenarios intended to reduce the level of contamination. This paper, the fourth on this topic, reports the results of recent contamination-migration simulations and their relevance to a decision whether to bake-out the ACIS instrument.

X-ray astronomy CCDs↗
NASA NTRS2017

Calibrating the IXPE Observatory from Ground to Space

The Imaging X-ray Polarimetry Explorer (IXPE) will be the next SMEX mission launched by NASA in 2021 in collaboration with the Italian Space Agency (ASI). IXPE will perform groundbreaking measurements of imaging polarization in X-rays for a number of different classes of sources with three identical telescopes, finally (re)opening a window in the high energy Universe after more than 40 years since the first pioneering results. The unprecedented sensitivity of IXPE to polarization poses peculiar requirements on the payload calibration, e.g. the use of polarized and completely unpolarized radiation, both on ground and in orbit, and can not rely on a systematic comparison with results obtained by previous observatories. In this paper, we will present the IXPE calibration plan, describing both calibrations which will be performed on the detectors at INAF-IAPS in Rome (Italy) and the calibration on the mirror and detector assemblies which will be carried out at Marshall Space Flight Center in Huntsville, Alabama. On orbit calibrations, performed with calibrations sources mounted on a filter wheel and placed in front of each detector when necessary, will be presented as well.

X-ray astronomy Polarimetry Calibratio↗
NASA NTRS2016

Active Full-Shell Grazing-Incidence Optics

MSFC has a long history of developing full-shell grazing-incidence x-ray optics for both narrow (pointed) and wide field (surveying) applications. The concept presented in this paper shows the potential to use active optics to switch between narrow and wide-field geometries, while maintaining large effective area and high angular resolution. In addition, active optics has the potential to reduce errors due to mounting and manufacturing lightweight optics. The design presented corrects low spatial frequency error and has significantly fewer actuators than other concepts presented thus far in the field of active x-ray optics. Using a finite element model, influence functions are calculated using active components on a full-shell grazing-incidence optic. Next, the ability of the active optic to effect a change of optical prescription and to correct for errors due to manufacturing and mounting is modeled.

Full-shell↗
NASA NTRS2015

The X-Ray Surveyor Mission: A Concept Study

NASA's Chandra X-ray Observatory continues to provide an unparalleled means for exploring the high-energy universe. With its half-arcsecond angular resolution, Chandra studies have deepened our understanding of galaxy clusters, active galactic nuclei, galaxies, supernova remnants, neutron stars, black holes, and solar system objects. As we look beyond Chandra, it is clear that comparable or even better angular resolution with greatly increased photon throughput is essential to address ever more demanding science questions-such as the formation and growth of black hole seeds at very high redshifts; the emergence of the first galaxy groups; and details of feedback over a large range of scales from galaxies to galaxy clusters. Recently, we initiated a concept study for such a mission, dubbed X-ray Surveyor. The X-ray Surveyor strawman payload is comprised of a high-resolution mirror assembly and an instrument set, which may include an X-ray microcalorimeter, a high-definition imager, and a dispersive grating spectrometer and its readout. The mirror assembly will consist of highly nested, thin, grazing-incidence mirrors, for which a number of technical approaches are currently under development-including adjustable X-ray optics, differential deposition, and new polishing techniques applied to a variety of substrates. This study benefits from previous studies of large missions carried out over the past two decades and, in most areas, points to mission requirements no more stringent than those of Chandra.

Astronomy↗
NASA NTRS2015

Achieving Zero Stress in Iridium, Chromium, and Nickel Thin Films

We examine a method for achieving zero intrinsic stress in thin films of iridium, chromium, and nickel deposited by magnetron sputter deposition. The examination of the stress in these materials is motivated by efforts to advance the optical performance of light-weight x-ray space telescopes into the regime of sub-arc second resolution that rely on control of the film stress to values within 10-100 MPa. A characteristic feature of the intrinsic stress behavior in chromium and nickel is their sensitivity to the magnitude and sign of the intrinsic stress with argon gas pressure, including the existence of a critical pressure that results in zero film stress. This critical pressure scales linearly with the film's density. While the effect of stress reversal with argon pressure has been previously reported by Hoffman and others for nickel and chromium, we have discovered a similar behavior for iridium. Additionally, we have identified zero stress in iridium shortly after island coalescence. This feature of film growth is used for achieving a total internal stress of -2.89 MPa for a 15.8 nm thick iridium film. The surface roughness of this low-stress film was examined using scanning probe microscopy (SPM) and x-ray reflectivity (XRR) at CuKα and these results presented and discussed.

X-ray↗
NASA NTRS2015

Modeling Contamination Migration on the Chandra X-Ray Observatory - III

During its first 16 years of operation, the cold (about -60 C) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), aboard the Chandra X-ray Observatory, has accumulated a growing layer of molecular contamination that attenuates low-energy x rays. Over the past few years, the accumulation rate, spatial distribution, and composition have changed. This evolution has motivated further analysis of contamination migration within and near the ACIS cavity, in part to evaluate potential bake-out scenarios intended to reduce the level of contamination. Keywords: X-ray astronomy, CCDs, contamination, modeling and simulation, spacecraft operations

astrophysics↗
NASA NTRS2015

X-Ray Optics at NASA Marshall Space Flight Center

NASA's Marshall Space Flight Center (MSFC) engages in research, development, design, fabrication, coating, assembly, and testing of grazing-incidence optics (primarily) for x-ray telescope systems. Over the past two decades, MSFC has refined processes for electroformed-nickel replication of grazing-incidence optics, in order to produce high-strength, thin-walled, full-cylinder x-ray mirrors. In recent years, MSFC has used this technology to fabricate numerous x-ray mirror assemblies for several flight (balloon, rocket, and satellite) programs. Additionally, MSFC has demonstrated the suitability of this technology for ground-based laboratory applications-namely, x-ray microscopes and cold-neutron microscopes and concentrators. This mature technology enables the production, at moderately low cost, of reasonably lightweight x-ray telescopes with good (15-30 arcsecond) angular resolution. However, achieving arcsecond imaging for a lightweight x-ray telescope likely requires development of other technologies. Accordingly, MSFC is conducting a multi-faceted research program toward enabling cost-effective production of lightweight high-resolution x-ray mirror assemblies. Relevant research topics currently under investigation include differential deposition for post-fabrication figure correction, in-situ monitoring and control of coating stress, and direct fabrication of thin-walled full-cylinder grazing-incidence mirrors.

X-ray Optics↗
NASA NTRS2015

Techniques for Achieving Zero Stress in Thin Films of Iridium, Chromium, and Nickel

We examine techniques for achieving zero intrinsic stress in thin films of iridium, chromium, and nickel deposited by magnetron sputter deposition. The intrinsic stress is further correlated to the microstructural features and physical properties such as surface roughness and optical density at a scale appropriate to soft X-ray wavelengths. The examination of the stress in these materials is motivated by efforts to advance the optical performance of light-weight X-ray space telescopes into the regime of sub-arcsecond resolution through various deposition techniques that rely on control of the film stress to values within 10-100 MPa. A characteristic feature of the intrinsic stress behavior in chromium and nickel is their sensitivity to the magnitude and sign of the intrinsic stress with argon gas pressure and deposition rate, including the existence of a critical argon process pressure that results in zero film stress which scales linearly with the atomic mass of the sputtered species. While the effect of stress reversal with argon pressure has been previously reported by Hoffman and others for nickel and chromium, we report this effect for iridium. In addition to stress reversal, we identify zero stress in the optical functioning iridium layer shortly after island coalescence for low process pressures at a film thickness of approximately 35nm. The measurement of the low values of stress during deposition was achieved with the aid of a sensitive in-situ instrument capable of a minimum detectable level of stress, assuming a 35nm thick film, in the range of 0.40-6.0 MPa for <111> oriented crystalline silicon substrate thicknesses of 70-280 microns, respectively.

X-ray optical thin films↗