Engineering topics
ODell, Steve
Publications and source records attributed to ODell, Steve.
Differential Deposition for Figure-Corrections in Grazing-Incidence X-Ray Optics
No abstract available
Incoming Metrology of Segmented X-Ray Mandrels at MSFC
The Constellation-X Spectroscopy X-ray telescope (SXT) is designed to be built from X-ray optic segments. The X-ray segments will be fabricated from the segmented mandrels using a replication process. The purpose of the incoming metrology is to map the surface of the mandrels, so the performance of the X-ray optics produced can be predicted. Three Constellation-X segmented mandrels have been delivered to MSFC for incoming metrology. The segmented mandrels are 30-degree sections of a cylindrical surface and have diameters of 1.0 m, 1.2 m and 1.6 m. The maximum dimensions of the optical surface are 1.0 m axial length and 0.5 m azimuthal segment length. The metrology of the mandrels consists of the measurement of their slope differences, roundness, absolute radius, axial profile and microroughness. Accuracy goals for each type of measurement and the accuracy of the instruments used for the measurements will be discussed. The results of the mandrel metrology together with the performance predictions will be presented.
Composition of the Chandra ACIS Contaminant
The Advanced CCD Imaging Spectrometer (ACIS) on the Chandra X-ray Observatory is suffering a gradual loss of low energy sensitivity due to a buildup of a contaminant. High resolution spectra of bright astrophysical sources using the Chandra Low Energy Transmission Grating Spectrometer (LETGS) have been analyzed in order to determine the nature of the contaminant by measuring the absorption edges. The dominant element in the contaminant is carbon. Edges due to oxygen and fluorine are also detectable. We can place stringent limits on nitrogen and high Z elements such as AI, Si, and Mg. Not including H, we find that C, O, and F comprise less than 80%, 7%, and 7% of the contaminant by number, respectively, Nitrogen is less than 3% of the contaminant. We will assess various candidates for the contaminating material and the time dependence. For example, the detailed structure of the absorption edges provides information about the bonding structure of the compound, eliminating aromatic hydrocarbons as the contaminating material.
AM03-AM121-115 Hard X-Ray Optics Development at MSFC
We have developed the electroformed-nickel replication process to enable us to fabricate light-weight hard-x-ray region. Two projects currently utilizing this technology are the production of over 250 r from 5 to 10 cm, for our HERO balloon payload, and 15- and 23-cm-diameter shells for a prototype module. The challenge for the former is to fabricate, mount, align and fly a large number of high-r constraints of a modest budget. For the latter, the challenge is to maintain high angular resolution shell thicknesses (100 micron) which make the shells extremely sensitive to electroforming stresses process does not degrade the ultra-smooth surface finish (approx. 3 A required for eventual multilayer c on these two programs.