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ODell, Steven L.

Publications and source records attributed to ODell, Steven L..

X-Ray Scattering Polarimeters: An Overview

X-Ray polarimeters that exploit the polarization-dependence of Thompson scattering were among the first utilized to detect the linear polarization from an X-Ray source. We review the basic principals, survey and compare different approaches and contrast these with other techniques.

Weisskopf, Martin C.↗