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Ortiz, Keith

Publications and source records attributed to Ortiz, Keith.

Solid-state information pattern discriminating switch

A maze-based switch generally having three functional blocks is disclosed. The first functional block handles communications by accepting an entered maze pattern from an external system controller and outputting the entered maze pattern (and optionally its directional complement) to the second functional block. The second functional block stores the maze pattern (and optionally its directional complement) to a permanent storage element and outputs the stored, entered maze pattern and its directional complement to a series of transistors in the third functional block. The third functional block is an electronic maze in which a correct maze pattern and its directional complement must be received by the transistors for the transistors to pass electrical power through the electronic maze to a connected element. The third functional block may alternatively be implemented with optical elements, optoelectronic elements, microelectromechanical elements, or elements formed by other microsystem technologies.

Galambos, Paul C.↗

Random loading fatigue crack growth: Crack closure considerations

The prediction of fatigue crack growth is an important element of effective fracture control for metallic structures and mechanical components, especially in the aerospace industry. The prediction techniques available and applied today are mostly based on fatigue crack growth measurements determined in constant amplitude testing. However, while many service loadings are constant amplitude, many more loadings are random amplitude. An investigation to determine which statistics of random loadings are relevant to fatigue crack closure was conducted. The fundamentals of random processes and crack closure are briefly reviewed, then the relevance of certain random process parameters to the crack closure calculation are discussed qualitatively. A course for further research is outlined.

Ortiz, Keith↗