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Osantowski, J.

Publications and source records attributed to Osantowski, J..

Optical surface analysis code (OSAC)

A computer program for the evaluation of surface ripple effects on an optical system is discussed. The program consists of a modification of conventional ray tracing so that the effects of all roughness frequency scales on image quality can be analyzed. The code is designed to deal with image quality problems arising in connection with X-ray telescopes and near-normal incidence systems used in the infrared, visible, and near-UV parts of the spectrum. The emphasis of the program analysis is on narrow angle scattering and its effect on image quality. The intent is to provide the optical engineer with a measure of the sensitivity of image quality to various surface characteristics. The paper will highlight some of the unique modeling features of the code, and illustrate some system examples.

Noll, R. J.

Extreme ultraviolet optical properties of two SiO2 based low-expansion materials

The reflectances of two low-expansion materials, a recrystallized glass ceramic and a high silica glass, have been measured at five angles of incidence from 15 to 85 deg in the wavelength region from 80 to 310 A and in some cases up to 1050 A. Optical constants are derived and silicon core-level transitions analyzed.

Rife, J.

Ultraviolet optical properties of diamond.

Absolute reflection spectrum of type iia diamond at room temperatures from 4 to 30 ev, obtaining ultraviolet optical constants and complex dielectric constant

DIELECTRIC CONSTANT