Engineering topics

Park, A.

Publications and source records attributed to Park, A..

6 records

NASA NTRS1990

Constitutive parameter de-embedding using inhomogeneously-filled rectangular waveguides with longitudinal section modes

Constitutive parameter extraction from S parameter data using a rectangular waveguide whose cross section is partially filled with a material sample as opposed to being completely filled was examined. One reason for studying a partially filled geometry is to analyze the effect of air gaps between the sample and fixture for the extraction of constitutive parameters. Air gaps can occur in high temperature parameter measurements when the sample was prepared at room temperature. Single port and two port measurement approaches to parameter extraction are also discussed.

Park, A.↗

NASA NTRS1989

Constitutive parameter measurements of lossy materials

The electrical constitutive parameters of lossy materials are considered. A discussion of the NRL arch for lossy coatings is presented involving analytical analyses of the reflected field using the geometrical theory of diffraction (GTD) and physical optics (PO). The actual values for these parameters can be obtained through a traditional transmission technique which is examined from an error analysis standpoint. Alternate sample geometries are suggested for this technique to reduce sample tolerance requirements for accurate parameter determination. The performance for one alternate geometry is given.

Dominek, A.↗

NASA NTRS1988

Measurement of the properties of lossy materials inside a finite conducting cylinder

A computer code was developed to automatically perform swept frequency reflection and transmission measurements using a HP5510B Network Analyzer and computer. This software is used in conjunction with a modified high temperature test rig to obtain reflection measurements from a flat material sample. The software allows data processing to eliminate measurement errors and to obtain a reflection coefficient in the frequency or time domain. A description of the program is presented.

Caldecott, R.↗

NASA NTRS1988

Material parameter determination from scattering measurements

The electrical, macroscopic performance of isotropic material can generally be described through their constitutive scalar parameters, permittivity and permeability which are symbolically represented by epsilon and mu, respectively. These parameters relate the electric and magnetic flux densities to the electric and magnetic fields through the following relationships: (1) D=epsilonE; and (2) B=muH. It is through these parameters that the interaction of electromagnetic waves with material can be quantized in terms of reflection and transmission coefficients, and propagation and attenuation factors.

Dominek, A.↗

NASA NTRS1988

Material parameter measurements at high temperatures

Alternate fixtures of techniques for the measurement of the constitutive material parameters at elevated temperatures are presented. The technique utilizes scattered field data from material coated cylinders between parallel plates or material coated hemispheres over a finite size groundplane. The data acquisition is centered around the HP 8510B Network Analyzer. The parameters are then found from a numerical search algorithm using the Newton-Ralphson technique with the measured and calculated fields from these canonical scatters. Numerical and experimental results are shown.

Dominek, A.↗

NASA NTRS1988

Measurement of the properties of lossy materials inside a finite conducting cylinder

Broadband, swept frequency measurement techniques were investigated for the evaluation of the electrical performance of thin, high temperature material coatings. Reflections and transmission measurements using an HP8510B Network Analyzer were developed for an existing high temperature test rig at NASA Lewis Research Center. Reflection measurements will be the initial approach used due to fixture simplicity even though surface wave transmission measurements would be more sensitive. The minimum goal is to monitor the electrical change of the material's performance as a function of temperature. If possible, the materials constitutive parameters, epsilon and muon will be found.

Dominek, A.↗