Engineering topics

Pascual, J. Garcia

Publications and source records attributed to Pascual, J. Garcia.

2 records

DOE OSTI2021

Impact of radiation on electronics and opto-electronics

In this chapter we will present the results of the impact of radiation on electronics and opto-electronics for two of the LHC experiments during Run 1 and Run 2. ATLAS results are presented in Section 6.1; CMS in Section 6.2. In Section 6.3 we will present a comparison between the two experiments, highlighting operational guidelines and proposing solutions to build the electronics and opto-electronics of the future LHC experiments.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2020

Measurements of Single Event Upset in ATLAS IBL

Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.

47 OTHER INSTRUMENTATION↗