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Pease, D. M.

Publications and source records attributed to Pease, D. M..

X-ray-based displacement measurement for hostile environments

A new method on noncontacting, high temperature extensometry based on the focus and scanning of X-rays is currently under development and shows great promise of overcoming limitations associated with available techniques. The chief advantage is the ability to make undisturbed measurements through stratified or flowing gases, smoke, and flame. The system is based on the ability to focus and scan low energy, hard X-rays such as those emanating from copper or molybdenum sources. The X-rays are focused into a narrow and intense line image which can be scanned onto targets that fluoresce secondary X-ray radiation. The final goal of the system is the ability to conduct macroscopic strain measurements in hostile environments by utilizing two or more fluorescing targets. Current work is limited to displacement measurement of a single target with a resolution of 1.25 micro-m and a target temperature of 1200 C, directly through an open flame. The main advantage of the technique lies in the penetrating nature of X-rays which are not affected by the presence of refracting gas layers, smoke, flame, or intense thermal radiation, all of which could render conventional extensometry methods inoperative or greatly compromise their performance.

Canistraro, H. A.

X-ray beam method for displacement measurement in hostile environments

A new method of extensometry using an X-ray beam was devised, and the results of current testing reveal it to be highly feasible. This technique has been shown to provide a non-contacting system that is immune to problems associated with density variations in gaseous environments, that plague currently available optical methods. This advantage is a result of the non-refracting penetrating nature of X-rays. The method is based on X-ray-induced X-ray fluorescence of targets, which subsequently serve as fudicial markers. Some target materials have melting points over 1600 degrees C which will facilitate measurement at extremely high temperatures. A highly focused intense X-ray beam, which is produced using a Johansen 'bent crystal', is then scanned across the target, which responds by fluorescing X-rays when stimulated by the incident beam. This secondary radiation is monitored using a detector. By carefully measuring beam orientation, change in target edge position can be determined. Many variations on this basic theme are now possible such as two targets demarcating a gage length, or a beam shadowing method using opaque targets.

Jordan, Eric H.

X-ray based extensometry

A totally new method of extensometry using an X-ray beam was proposed. The intent of the method is to provide a non-contacting technique that is immune to problems associated with density variations in gaseous environments that plague optical methods. X-rays are virtually unrefractable even by solids. The new method utilizes X-ray induced X-ray fluorescence or X-ray induced optical fluorescence of targets that have melting temperatures of over 3000 F. Many different variations of the basic approaches are possible. In the year completed, preliminary experiments were completed which strongly suggest that the method is feasible. The X-ray induced optical fluorescence method appears to be limited to temperatures below roughly 1600 F because of the overwhelming thermal optical radiation. The X-ray induced X-ray fluorescence scheme appears feasible up to very high temperatures. In this system there will be an unknown tradeoff between frequency response, cost, and accuracy. The exact tradeoff can only be estimated. It appears that for thermomechanical tests with cycle times on the order of minutes a very reasonable system may be feasible. The intended applications involve very high temperatures in both materials testing and monitoring component testing. Gas turbine engines, rocket engines, and hypersonic vehicles (NASP) all involve measurement needs that could partially be met by the proposed technology.

Jordan, E. H.