Pellish, J. | Search NASA

NASA NTRS2019

Screening Parts for Space Missions Using a Pulsed Laser to Test for Failures

This presentation gives an overview pulsed laser testing methods and practical examples for radiation hardness assurance in space system electronics.

Radiation hardness assurance↗

NASA NTRS2015

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

Space applications are complex systems that require intricate trade analyses for optimum implementations. We focus on a subset of the trade process, using classical reliability theory and SEU data, to illustrate appropriate TMR scheme selection.

Field Programmable Gate Array (FPGA)↗