Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates
Abstract not provided
Liu, Yafei↗
Engineering topics
Peng, Hongyu
Publications and source records attributed to Peng, Hongyu.
Characterization of Hazy Morphology on AlInP/GaAs Epitaxial Wafers Grown by Organometallic Vapor Phase Epitaxy
Abstract not provided
Peng, Hongyu↗
Synchrotron X-ray Topography Characterization of Commercial GaN Substrates for Power Electronic Applications
Abstract not provided
Liu, Yafei↗
Characterization of Dislocations in 4H-SiC Single Crystals at the Initial Growth Stage by Synchrotron X-ray Topography
Abstract not provided
Ailihumaer, Tuerxun↗
Analysis of Dislocations in PVT-Grown 6H-SiC through Grazing-Incidence X-Ray Topographic Images and Ray-Tracing Simulation
Abstract not provided
Cheng, Qianyu↗