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Peralta, Christopher L.

Publications and source records attributed to Peralta, Christopher L..

Searching for Grid-Forming Technologies That Do Not Impact Protection Systems: A promising technology

The design of legacy-line protection elements has been guided by the behavior of synchronous machines during faults. Because of the significant field-winding inductance and rotating mass, the magnitude, angular frequency, and phase angle of the back-electromotive force (EMF) voltage waveforms of synchronous machines remain practically constant for several hundreds of milliseconds after a fault occurs. Furthermore this has facilitated the engineering of the memory-polarization technique in mho distance elements, which has been effective for machine-dominant power grids. However, this assumption is no longer held for inverter-based resources (IBRs) because of the lack of field winding and moment of inertia in power electronics devices. Notably, the negative-sequence directional overcurrent protection and the quadrilateral distance elements have been impacted by early IBRs with grid-following (GFL) controls because they did not inject negative-sequence currents during asymmetrical faults.

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A Time-Domain Protection Approach for AC Transmission Systems With Grid-Forming Resources

Ac transmission protection must reliably detect, classify, and locate short-circuit faults from voltage and current measurements. At present, these functionalities, which have been classically engineered using phasors approaches, are being challenged by the dynamic behavior and fault-current limits of converter-based generation. This paper tackles these challenges by engineering a time-domain protection approach that leverages the classical Bergeron model in a new manner. Low- and high-impedance faults are detected and classified by ascertaining how well line voltage and current measurements match the Bergeron equations. Faults are located by posing a novel one-variable optimization problem, whereas voltage and current waveforms at the fault location are estimated by unveiling rigorous relationships. The proposed elements are secure against external faults, measurement errors, and variation of line parameters and sampling time. Furthermore, these advances are tested via electromagnetic transient simulations and are significant to satisfy IEEE and North American Electric Reliability Corporation requirements.

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