Defect recovery processes in Cr-B binary and Cr-Al-B MAB phases: structure-dependent radiation tolerance
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Kim, Jun Young (ORCID:0000000231542588)↗
Engineering topics
Perepezko, John H. (ORCID:0000000228146816)
Publications and source records attributed to Perepezko, John H. (ORCID:0000000228146816).