Engineering topics

Perlman, Marvin

Publications and source records attributed to Perlman, Marvin.

3 records

NASA NTRS1994

Mapping Between Distinct Reed-Solomon Codes

One-to-one mapping between two Reed-Solomon (RS) codes devised to enable decoder designed for one of codes to operate on other one also. Codes in question must have same N and K parameters (defined below) but otherwise be two distinct RS codes. Mapping intended to enable same ground-based decoder to decode telemetry signals from two spacecraft in two different RS codes of (N,K) = (255,223). Also useful in purely terrestrial data communications and in optical and magnetic recording and playback of digitized audio and video signals. Implemented in interface circuitry and/or software to enable communication between coding systems of different manufacturers using different RS codes within same (N,K) family.

Perlman, Marvin↗

NASA NTRS1991

Asymmetric soft-error resistant memory

A memory system is provided, of the type that includes an error-correcting circuit that detects and corrects, that more efficiently utilizes the capacity of a memory formed of groups of binary cells whose states can be inadvertently switched by ionizing radiation. Each memory cell has an asymmetric geometry, so that ionizing radiation causes a significantly greater probability of errors in one state than in the opposite state (e.g., an erroneous switch from '1' to '0' is far more likely than a switch from '0' to'1'. An asymmetric error correcting coding circuit can be used with the asymmetric memory cells, which requires fewer bits than an efficient symmetric error correcting code.

Buehler, Martin G.↗

NASA NTRS1990

Asymmetric Memory Circuit Would Resist Soft Errors

Some nonlinear error-correcting codes more efficient in presence of asymmetry. Combination of circuit-design and coding concepts expected to make integrated-circuit random-access memories more resistant to "soft" errors (temporary bit errors, also called "single-event upsets" due to ionizing radiation). Integrated circuit of new type made deliberately more susceptible to one kind of bit error than to other, and associated error-correcting code adapted to exploit this asymmetry in error probabilities.

Buehler, Martin G.↗