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Pickel, James C.

Publications and source records attributed to Pickel, James C..

Monte Carlo Treatment of Displacement Damage in Bandgap Engineered HgCdTe Detectors

The conclusion are: 1. Description of NIEL calculation for short, mid, and longwave HgCdTe material compositions. 2. Full recoil spectra details captured and analyzed Importance of variance in high Z materials. 3. Can be applied directly to calculate damage distributions in arrays. 4. Future work will provide comparisons of measured array damage with calculated NIEL and damage energy distributions. 5. Technique to assess the full recoil spectrum behavior is extendable to other materials.

Fodness, Bryan C.↗

Trends In Susceptibility To Single-Event Upset

Report provides nearly comprehensive body of data on single-event upsets due to irradiation by heavy ions. Combines new test data and previously published data from governmental and industrial laboratories. Clear trends emerge from data useful in predicting future performances of devices.

Nichols, Donald K.↗