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Potter, Kevin M.

Publications and source records attributed to Potter, Kevin M..

Automated segmentation of porous thermal spray material CT scans with predictive uncertainty estimation

Abstract Thermal sprayed metal coatings are used in many industrial applications, and characterizing the structure and performance of these materials is vital to understanding their behavior in the field. X-ray computed tomography (CT) enables volumetric, nondestructive imaging of these materials, but precise segmentation of this grayscale image data into discrete material phases is necessary to calculate quantities of interest related to material structure. In this work, we present a methodology to automate the CT segmentation process as well as quantify uncertainty in segmentations via deep learning. Neural networks (NNs) have been shown to excel at segmentation tasks; however, memory constraints, class imbalance, and lack of sufficient training data often prohibit their deployment in high resolution volumetric domains. Our 3D convolutional NN implementation mitigates these challenges and accurately segments full resolution CT scans of thermal sprayed materials with maps of uncertainty that conservatively bound the predicted geometry. These bounds are propagated through calculations of material properties such as porosity that may provide an understanding of anticipated behavior in the field.

Martinez, Carianne↗

Automatic Detection of Defects in High-Reliability Components

Disastrous consequences can result from defects in manufactured parts—particularly the high consequence parts developed at Sandia. Identifying flaws in as-built parts can be done with nondestructive means, such as X-ray Computed Tomography (CT). However, due to artifacts and complex imagery, the task of analyzing the CT images falls to humans. Human analysis is inherently unreproducible, unscalable, and can easily miss subtle flaws. We hypothesized that deep learning methods could improve defect identification, increase the number of parts that can effectively be analyzed, and do it in a reproducible manner. We pursued two methods: 1) generating a defect-free version of a scan and looking for differences (PandaNet), and 2) using pre-trained models to develop a statistical model of normality (Feature-based Anomaly Detection System: FADS). Both PandaNet and FADS provide good results, are scalable, and can identify anomalies in imagery. In particular, FADS enables zero-shot (training-free) identification of defects for minimal computational cost and expert time. It significantly outperforms prior approaches in computational cost while achieving comparable results. FADS’ core concept has also shown utility beyond anomaly detection by providing feature extraction for downstream tasks.

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