Engineering topics

Prutton, M.

Publications and source records attributed to Prutton, M..

3 records

NASA NTRS1985

Some strategies for quantitative scanning Auger electron microscopy

The general applicability of power law forms of the background in electron spectra is pointed out and exploited for background removal from under Auger peaks. This form of B(E) is found to be extremely sensitive to instrumental alignment and to fault-free construction - an observation which can be used to set up analyser configurations in an accurate way. Also, differences between N(E) and B(E) can be used to derive a spectrometer transmission function T(E). The questions of information density in an energy-analysing spatially-resolving instrument are addressed after reliable instrumental characterization has been established. Strategies involving ratio histograms, showing the population distribution of the ratio of a pair of Auger peak heights, composition scatter diagrams and windowed imaging are discussed and illustrated.

Browning, R.↗

NASA NTRS1983

Techniques for the correction of topographical effects in scanning Auger electron microscopy

A number of ratioing methods for correcting Auger images and linescans for topographical contrast are tested using anisotropically etched silicon substrates covered with Au or Ag. Thirteen well-defined angles of incidence are present on each polyhedron produced on the Si by this etching. If N1 electrons are counted at the energy of an Auger peak and N2 are counted in the background above the peak, then N1, N1 - N2, (N1 - N2)/(N1 + N2) are measured and compared as methods of eliminating topographical contrast. The latter method gives the best compensation but can be further improved by using a measurement of the sample absorption current. Various other improvements are discussed.

Prutton, M.↗

NASA NTRS1982

New oxidation features in NiCrAl-Zr revealed by an Auger microprobe

A NiCrAl-0.5 (wt %) Zr alloy, oxidized in air for 1 h at 1180 C was studied using a 30-nm resolution Auger microprobe. Depth analysis was achieved using crater edge profiling. This first application of AES to these alloys enabled several new observations of the chemical composition of microstructural features in the corrosion layer. The external oxide was rough, about 2-3 microns thick, and contained Ni, Cr, Al, and O. It was discovered that stoichiometric Al2O3 was restricted to a homogeneous layer about 300-nm thick between the oxide and the base metal. The metal immediately beneath this Al2O3 layer was found to be depleted in Al and roughly ten times richer in Zr than the bulk alloy. These observations are compared with the predictions of current models of the oxidation of MCrAl alloys.

Larson, L. A.↗