Engineering topics

Purviance, J. E.

Publications and source records attributed to Purviance, J. E..

3 records

NASA NTRS1991

DC and small-signal physical models for the AlGaAs/GaAs high electron mobility transistor

Analytical and numerical models are developed for the microwave small-signal performance, such as transconductance, gate-to-source capacitance, current gain cut-off frequency and the optimum cut-off frequency of the AlGaAs/GaAs High Electron Mobility Transistor (HEMT), in both normal and compressed transconductance regions. The validated I-V characteristics and the small-signal performances of four HeMT's are presented.

Sarker, J. C.↗

NASA NTRS1990

Real time SAR processing

A simplified model for the SAR imaging problem is presented. The model is based on the geometry of the SAR system. Using this model an expression for the entire phase history of the received SAR signal is formulated. From the phase history, it is shown that the range and the azimuth coordinates for a point target image can be obtained by processing the phase information during the intrapulse and interpulse periods respectively. An architecture for a VLSI implementation for the SAR signal processor is presented which generates images in real time. The architecture uses a small number of chips, a new correlation processor, and an efficient azimuth correlation process.

Premkumar, A. B.↗

NASA NTRS1990

Statistical circuit design for yield improvement in CMOS circuits

This paper addresses the statistical design of CMOS integrated circuits for improved parametric yield. The work uses the Monte Carlo technique of circuit simulation to obtain an unbiased estimation of the yield. A simple graphical analysis tool, the yield factor histogram, is presented. The yield factor histograms are generated by a new computer program called SPICENTER. Using the yield factor histograms, the most sensitive circuit parameters are noted, and their nominal values are changed to improve the yield. Two basic CMOS example circuits, one analog and one digital, are chosen and their designs are 'centered' to illustrate the use of the yield factor histograms for statistical circuit design.

Kamath, H. J.↗