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Reininger, R

Publications and source records attributed to Reininger, R.

Optimization of the Coherent Intensity from Multi-Segment Undulators by Phase Matching

The use of inline insertion devices at third-generation synchrotron radiation sources can result in destructive interference effects if the relative phase between the devices is not properly adjusted. The destructive interference can strongly affect the emission spectrum and coherent wavefront of a compound insertion device. We simulate the photon source generated by a dual-inline elliptically polarizing undulator (EPU) situated in a low-{beta} straight section of the planned NSLS-II storage ring and show that a magnetic chicane with adjustable field integral can be used to phase-match the devices. Furthermore, we show that the maximum coherent intensity is delivered by a focusing x-ray beamline if the chicane is adjusted to phase-match the off-axis and red-shifted radiation. Such a system will be installed at the coherent soft x-ray (CSX) beamline of the NSLS-II in order to provide the highest possible coherent flux for coherent soft x-ray scattering experiments.

36 MATERIALS SCIENCE↗

The electron spectro-microscopy beamline at National Synchrotron Light Source II: A wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy ({mu}-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 {mu}m for ARPES and 0.5 {mu}m for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

New SRC APPLE ll Variable Polarization Beamline

SRC has recently commissioned a new Varied Line-Spacing Plane Grating Monochromator (VLS-PGM) utilizing as its source a 1 m long APPLE II insertion device in short-straight-section 9 of the Aladdin storage ring. The insertion device reliably delivers horizontal, vertical, and right and left circularly polarized light to the beamline. Measurements from an in situ polarimeter can be used for undulator corrections to compensate for depolarizing effects of the beamline. The beamline has only three optical elements and covers the energy range from 11.1 to 270 eV using two varied line-spacing gratings. A plane mirror rotates to illuminate the gratings at the correct angle to cancel the defocus term at all photon energies. An exit slit and elliptical-toroid refocusing mirror complete the beamline. Using a 50 {mu}m exit slit, the beamline provides moderate to high resolution, with measured flux in the mid 10{sup 12} (photons/s/200 mA) range, and a spot size of 400 {mu}m horizontal by 30 {mu}m vertical.

43 PARTICLE ACCELERATORS↗