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Romanofsky, R.

Publications and source records attributed to Romanofsky, R..

Modulation Study for Beam Steerable Reflectarray Antennas

The reflectarray antenna is a power-efficient antenna but with an inherent intersymbol interference (ISI) problem with digital modulations. The composite signal model of a reflectarray is established. The ISI is characterized by the signal components delays. The feed-to-element distance and the element-to-observation distance contribute to the total delay, with the latter having the major effect. The effect of typical phase shifters' phase errors is analyzed and evaluated. Simulations are performed. The analytical and simulation results for an example reflectarray at f(sub c) = 26.5 GHz and bit rate of 1.325 Gbps show that the BER degradation due to ISI is proportional to the symbol rate and the loss ranges from less than 1 dB to around 2 dB in E(sub b)/N(sub o), depending on original E(sub b)/N(sub o), for BPSK, QPSK, 8PSK and 16QAM. The phase error effect is negligible for lower order modulations and is unacceptable for higher order modulations such as 64 and 256QAM.

Xiong, Fuqin

Electro-optical Probing Of Terahertz Integrated Circuits

Electro-optical probe developed to perform noncontact, nondestructive, and relatively noninvasive measurements of electric fields over broad spectrum at millimeter and shorter wavelengths in integrated circuits. Manipulated with conventional intregrated-circuit-wafer-probing equipment and operated without any special preparation of integrated circuits. Tip of probe small electro-optical crystal serving as proximity electric-field sensor.

Bhasin, K. B.

External electro-optic probing of millimeter-wave integrated circuits

An external, noncontact electro-optic measurement system, designed to operate at the wafer level with conventional wafer probing equipment and without any special circuit preparation, has been developed. Measurements have demonstrated the system's ability to probe continuous and pulsed signals on microwave integrated circuits on arbitrary substrates with excellent spatial resolution. Experimental measurements on a variety of digital and analog circuits, including a GaAs selectively-doped heterostructure transistor prescaler, an NMOS silicon multiplexer, and a GaAs power amplifier MMIC are reported.

Whitaker, J. F.