Engineering topics

Ross, Ronald G., Jr.

Publications and source records attributed to Ross, Ronald G., Jr..

13 records

NASA NTRS2013

PV Reliability Development Lessons from JPL's Flat Plate Solar Array Project

Key reliability and engineering lessons learned from the 20-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project and thin film module reliability research activities are presented and analyzed. Particular emphasis is placed on lessons applicable to evolving new module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulate and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.

photovoltaics↗

NASA NTRS2006

An Overview of NASA Space Cryocooler Programs--2006

Mechanical cryocoolers represent a significant enabling technology for NASA's Earth and Space Science Enterprises. Many of NASA's space instruments require cryogenic refrigeration to improve dynamic range, extend wavelength coverage, or enable the use of advanced detectors to observe a wide range of phenomena--from crop dynamics to stellar birth. Reflecting the relative maturity of the technology at these temperatures, the largest utilization of coolers over the last fifteen years has been for instruments operating at medium to high cryogenic temperatures (55 to 150K). For the future, important new developments are focusing on the lower temperature range, from 6 to 20 K, in support of studies of the origin of the Universe and the search for planets around distant stars. NASA's development of a 20K cryocooler for the European Planck spacecraft and a 6 K cryocooler for the MIRI instrument on the James Webb Space Telescope (JWST) are examples of the thrust to provide low-temperature cooling for this class of future missions.

cryogenics↗

NASA NTRS1995

Thermal Strap Increases Cryocooling Efficiency

Report discusses concept for decreasing compressor power consumed by spacecraft mechanical cryocooler providing 0.5 W of refrigeration at temperature of 61 K at tip of cold finger. Involves connecting thermal strap between radiator or other heat sink at intermediate temperature and stiffening ring located on cold finger about one-third way from base to tip and attains temperature of about 250 K during normal operation. Depending upon specific design, electrical power consumed by mechanical cryocooler reduced by half.

Ross, Ronald G., Jr.↗

NASA NTRS1992

Demonstration of active vibration control on a stirling-cycle cryocooler testbed

SatCon Technology Corporation has demonstrated excellent vibration reduction performance using active control on the JPL Stirling-cycle cryocooler testbed. The authors address the use of classical narrowband feedback control to meet the cryocooler vibration specifications using one cryocooler in a self-cancellation configuration. Similar vibration reduction performance was obtained using a cryocooler back-to-back configuration by actively controlling a reaction mass actuator that was used to mimic the second cooler.

Johnson, Bruce G.↗

NASA NTRS1991

Electromagnetic compatibility characterization of a BAe Stirling-cycle cryocooler for space application

This paper describes the electromagnetic compatibility (EMC) measurements of an 80-K Stirling-cycle cooler. The measurements, performed in the JPL EMC test facility, include dc magnetic field characterization, radiated magnetic and electric field emissions, and conducted emissions on the internal lines between the cooler electronics and the cooler. The measurements conform to both the MILSTD-461C specifications as well as to the specifications for the NASA Earth Observing System.

Johnson, Dean L.↗

NASA NTRS1989

Magellan/Galileo solder joint failure analysis and recommendations

On or about November 10, 1988 an open circuit solder joint was discovered in the Magellan Radar digital unit (DFU) during integration testing at Kennedy Space Center (KSC). A detailed analysis of the cause of the failure was conducted at the Jet Propulsion Laboratory leading to the successful repair of many pieces of affected electronic hardware on both the Magellan and Galileo spacecraft. The problem was caused by the presence of high thermal coefficient of expansion heat sink and conformal coating materials located in the large (0.055 inch) gap between Dual Inline Packages (DIPS) and the printed wiring board. The details of the observed problems are described and recommendations are made for improved design and testing activities in the future.

Ross, Ronald G., Jr.↗

NASA NTRS1989

Encapsulants And Corrosion In Photovoltaic Modules

Paper reports studies of effects of moisture on photovoltaic modules, presenting data useful in further quantitative studies of such phenomena. Measured data used in computer simulation of two-dimensional conduction to analyze ionic-conduction characteristics of PVB- and EVA-encapsulated modules. Notes encapsulant plays important role in electrochemical processes in photovoltaic module. Indicates how variations in design parameters affect levels of leakage currents in modules. Points out likely leakage-current paths in modules at various temperatures and humidities. Compares results of field and laboratory tests of same specimens and notes greater severity of outdoor environment.

Mon, Gordon R.↗

NASA NTRS1989

Endurance Tests Of Amorphous-Silicon Photovoltaic Modules

Failure mechanisms in high-power service studied. Report discusses factors affecting endurance of amorphous-silicon solar cells. Based on field tests and accelerated aging of photovoltaic modules. Concludes that aggressive research needed if amorphous-silicon modules to attain 10-year life - value U.S. Department of Energy established as goal for photovoltaic modules in commercial energy-generating plants.

Ross, Ronald G., Jr.↗

NASA NTRS1988

Tests Of Amorphous-Silicon Photovoltaic Modules

Progress in identification of strengths and weaknesses of amorphous-silicon technology detailed. Report describes achievements in testing reliability of solar-power modules made of amorphous-silicon photovoltaic cells. Based on investigation of modules made by U.S. manufacturers. Modules subjected to field tests, to accelerated-aging tests in laboratory, and to standard sequence of qualification tests developed for modules of crystalline-silicon cells.

Ross, Ronald G., Jr.↗

NASA NTRS1988

Corrosion In Amorphous-Silicon Solar Cells And Modules

Paper reports on corrosion in amorphous-silicon solar cells and modules. Based on field and laboratory tests, discusses causes of corrosion, ways of mitigating effects, and consequences for modules already in field. Suggests sealing of edges as way of reducing entry of moisture. Cell-free perimeters or sacrificial electrodes suggested to mitigate effects of sorbed moisture. Development of truly watertight module proves to be more cost-effective than attempting to mitigate effects of moisture.

Mon, Gordon R.↗

NASA NTRS1988

Moisture interaction and stability of ZOT (Zinc Orthotitanate) thermal control spacecraft coating

Two of the many performance requirements of the zinc orthotitanate (ZOT) ceramic thermal control paint covering parts of the Jupiter-bound Galileo spacecraft are that it be sufficiently electrically conductive so as to prevent electrostatic discharge (ESD) damage to onboard electronics and that it adhere to and protect the substrate from corrosion in terrestrial environments. The bulk electrical resistivity of ZOT on an aluminum substrate was measured over the ranges 22 C to 90 C and 0 percent RH to 100 percent RH, and also in soft (10 (minus 2) Torr) and hard (10 (minus 7) Torr) vacuums. No significant temperature dependence was evident, but measured resistivity values ranged over 9 orders of magnitude: 10 to the 5th power ohm-cm at 100 percent RH greater than 10 to the 12th power ohm-cm in a hard vacuum. The latter value violates the ESD criterion for a typical 0.019 cm thick coating. The corrosion study involved exposing typical ZOT substrate combinations to two moisture environments - 30 C/85 percent RH and 85 C/85 percent RH - for 2000 hours, during which time the samples were periodically removed for front-to-back electrical resistance and scratch/peel test measurements. It was determined that the ZOT/Al and ZOT/Mg systems are stable (no ZOT delamination), although some corrosion (oxide formation) and resistivity increases observed among the ZOT/Mg samples warrant that exposure of some parts to humid environments be minimized.

Mon, Gordon R.↗

NASA NTRS1986

Characterization of photovoltaic array performance - An overview

Techniques are described for standardized performance monitoring of photovoltaic arrays. Performance is measured in terms of the array electrical output for a given set of environmental or standard reporting conditions or the total output per given time interval. The environmental conditions can be a standard 25 C or the normal operating temperature in the presence of 80 mW/sq cm irradiance, 20 C air temperature and 1 m/sec wind velocity. Methods are presented for converting the measurements over time into I-V characteristics representations for entire arrays. The techniques are accurate to within 5 percent, provided in situ data are collected and the distribution of the measured parameters is known.

Ross, Ronald G., Jr.↗

NASA NTRS1985

Crystalline-silicon reliability lessons for thin-film modules

Key reliability and engineering lessons learned from the 10-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project are presented and analyzed. Particular emphasis is placed on lessons applicable to the evolving new thin-film cell and module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulant and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.

Ross, Ronald G., Jr.↗