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DOE OSTI2021

On the Ambiguity of Using Isc for Analyzing Suns-Voc Data on Modules

In standard silicon solar modules, cells are strung in series with bypass diodes incorporated to reduce the effects of shading. When all of the strings are partially shaded the measured short circuit current is affected and the Isc of the module will be equal to that of the lowest current cell in the least shadowed string. In bifacial modules the ability to assess losses due to shading is especially important. This paper advocates an alternative approach to converting the raw suns-voc data to pseudo IV data in modules where shading may be affecting the suns-voc curve results.

41 EE - Solar Energy Technologies Office (EE-4S)↗

DOE OSTI2020

High Efficiency Silicon Module Degradation - From Atoms to Systems: Preprint

For PV to be cost competitive with traditional energy sources reliability is of critical importance. Historically, PV reliability has focused on the module packaging because degradation and failure modes were directly linked to the packaging. Today, in addition to module packaging cell related reliability issues can be observed. We show that silicon heterojunction (SHJ) degradation is directly linked to the re-distribution of hydrogen (H) near the interface between the amorphous-silicon (a-Si) and silicon bulk. PERC modules show a similar decline in carrier lifetime indicating that not the packaging but the cells are also changing during field exposure. Examination of a stressed PERC cell showed a similar H redistribution in the cell. Understanding the degradation mechanism at the atomic level is important in facilitating possible mitigating mechanisms and more accurately projecting performance.

degradation↗