Engineering topics
Publications and source records attributed to Schnable, G. L..
Insulator surface ion migration effects on MOS and bipolar integrated circuits, describing inversion voltage and surface conductivity and recombination velocities
MOS large scale IC phosphosilicate glass substrate vapor deposits effects, including hardness, pinhole density and electromigration
Test structure model for studying semiconductor- insulator interface related failure mechanisms in large scale integrated circuitry
Electron bombardment induced conductivity - ultraviolet imaging in the schuman region