Engineering topics

Shaftan, Timur

Publications and source records attributed to Shaftan, Timur.

6 records

DOE OSTI2025

Ultimate brightness of a medium-energy synchrotron light source at operational beam intensity

Synchrotron light sources are key instruments of modern science, providing unique opportunities for groundbreaking studies in diverse scientific disciplines and driving innovation in numerous scientific and technological fields. Fourth-generation light sources provide unprecedented capabilities in imaging, spectroscopy and diffraction techniques. Ultimate brightness is the key to advancing to a smaller scale, faster response, and higher data measurement and processing rate. The brightness is primarily determined by the electron beam emittance and energy spread at operational intensity. A common feature of fourth-generation synchrotrons is the short length of the electron bunches combined with a very small transverse beam size. Consequently, the high particle density leads to strong collective effects that significantly increase the emittance and limit the achievable brightness at operational beam intensity. In this article, we summarize our studies of the emittance and brightness scaled with the beam energy and intensity, taking into account the effects of intrabeam scattering, beam-impedance interaction and bunch lengthening provided by higher-harmonic RF systems to identify optimal combinations of machine and beam parameters.

36 MATERIALS SCIENCE↗

DOE OSTI2025

Online regularization of Poincaré map of storage rings with Shannon entropy

A measurable chaos indicator is used as the online optimization objective in tuning a complicated nonlinear system—the National Synchrotron Light Source-II storage ring. Through analyzing the Shannon entropy in measured Poincaré maps, not only can the commonly used nonlinear characterizations be extracted, but more importantly, the chaos can be quantified and then used for an online regularization of these maps. The method itself is general and applicable to other tunable nonlinear systems as well. Published by the American Physical Society 2025

36 MATERIALS SCIENCE↗

DOE OSTI2024

Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips

The resolution of a mega-electron-volt scanning transmission electron microscope (MeV-STEM) is primarily governed by the properties of the incident electron beam and angular broadening effects that occur within thick biological samples and microchips. A precise understanding and mitigation of these constraints require detailed knowledge of beam emittance, aberrations in the STEM column optics, and energy-dependent elastic and inelastic critical angles of the materials being examined. This simulation study proposes a standardized experimental framework for comprehensively assessing beam intensity, divergence, and size at the sample exit. This framework aims to characterize electron-sample interactions, reconcile discrepancies among analytical models, and validate Monte Carlo (MC) simulations for enhanced predictive accuracy. Our numerical findings demonstrate that precise measurements of these parameters, especially angular broadening, are not only feasible but also essential for optimizing imaging resolution in thick biological samples and microchips. By utilizing an electron source with minimal emittance and tailored beam characteristics, along with amorphous ice and silicon samples as biological proxies and microchip materials, this research seeks to optimize electron beam energy by focusing on parameters to improve the resolution in MeV-STEM/TEM. This optimization is particularly crucial for in situ imaging of thick biological samples and for examining microchip defects with nanometer resolutions. Our ultimate goal is to develop a comprehensive mapping of the minimum electron energy required to achieve a nanoscale resolution, taking into account variations in sample thickness, composition, and imaging mode.

36 MATERIALS SCIENCE↗

DOE OSTI2024

3D small-gain formula allowing strong focusing and harmonic lasing for a ring-based x-ray free electron laser oscillator

We present a detailed derivation of a formula for the small-gain calculation for an x-ray free electron laser oscillator (XFELO) based on a medium-energy (3–4 GeV) storage ring. We found harmonic lasing and strong focusing are essential for this beam energy range. Taking the small-signal low-gain formula developed by Kim and his colleagues, we modified it in such a way that the gain can be calculated without the “no focusing approximation,” and a strong focusing can be applied, as well as harmonic lasing. In this formula, the gain is represented as a product of two factors with one of them depending only on the harmonic number, undulator period, and gap. Using this factor, we show that it is favorable to use harmonic lasing to achieve hard x-ray FEL working in the small-signal low-gain regime with the medium-energy electron beam. Our formula also allows FEL optimization by varying the vertical gradient of the undulator, the vertical dispersion, and the horizontal and vertical focusing, independently. As an example, we applied this formula to study the feasibility of an XFELO option for the National Synchrotron Light Source II (NSLS-II) upgrade. Since a quite high peak current is required for the FEL, collective effects of beam dynamics in medium-energy synchrotrons significantly affect the electron beam parameters. We carried out a multiparameter optimization taking collective effects into account. Note, even though our example is for a ring-based XFELO at 3 to 4 GeV, the formula and, in particular, the approach developed here may be applied to other types of FELs. Published by the American Physical Society 2024

36 MATERIALS SCIENCE↗

DOE OSTI2024

Design study of a low emittance complex bend achromat lattice

Light sources worldwide have experienced rapid growth in the last decades, pushing toward higher brightness with lower emittance to meet growing demands from the user community. The quest for higher brightness motivates the development of low-emittance ring lattices. At this point, all fourth-generation storage ring light sources employ variations of the multibend achromat (MBA) lattice. In this paper, we discuss an extension of this approach, known as complex bend achromat lattice in relation to the future NSLS-II upgrade. A detailed approach for the lattice design will be described and the developed lattice will be presented. The advantages of using our complex bend approach are evident in reaching a natural emittance as low as 23 pm at a beam energy of 3 GeV, providing a straight section of 8.4 m for long insertion devices, and acquiring a ratio of about 50% of free space with respect to the ring circumference. The design includes the use of permanent magnets largely reducing the need for power supplies. Our new approach provides an extension to the MBA concept for the next-generation light source lattice design. Published by the American Physical Society 2024

36 MATERIALS SCIENCE↗

DOE OSTI2024

High Harmonic Generation Seeding Echo-Enabled Harmonic Generation toward a Storage Ring-Based Tender and Hard X-ray-Free Electron Laser

To align with the global trend of integrating synchrotron light source (SLS) and free electron laser (FEL) facilities on one site, in line with examples such as SPring-8 and SACLA in Japan and ELETTRA and FERMI in Italy, we actively explore FEL options leveraging the ultralow-emittance electron beam of the NSLS-II upgrade. These options show promising potential for synergy with storage ring (SR) operations, thereby significantly enhancing our facility’s capabilities. Echo-enabled harmonic generation (EEHG) is well-suited to SR-based FELs, and has already been demonstrated with the capability of generating extremely narrow bandwidth as well as high brightness, realized using diffraction-limited short pulses in transverse planes and Fourier transform-limited bandwidth in the soft X-ray spectrum. However, regarding a conventional EEHG scheme, the combination of the shortest seed laser wavelength (256 nm) and highest harmonic (200) sets the short wavelength limit to λ = 1.28 nm. To further extend the short wavelength limit down to the tender and hard X-ray region, a vital option is to shorten the seed laser wavelength. Thanks to recent advances in high harmonic generation (HHG), packing 10 9 photons at one harmonic within a few-femtosecond pulse could turn such a novel HHG source into an ideal seeding for EEHG. Thus, compared to the cascaded EEHG, the HHG seeding option could not only lower the cost, but also free the SR space for accommodating more user beamlines. Moreover, to mitigate the SASE background noise on the sample and detector, we combine the HHG seeding EEHG with the crab cavity short pulse scheme for maximum benefit.

36 MATERIALS SCIENCE↗