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Shaftan, Timur

Publications and source records attributed to Shaftan, Timur.

At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2025

Ultimate brightness of a medium-energy synchrotron light source at operational beam intensity

Synchrotron light sources are key instruments of modern science, providing unique opportunities for groundbreaking studies in diverse scientific disciplines and driving innovation in numerous scientific and technological fields. Fourth-generation light sources provide unprecedented capabilities in imaging, spectroscopy and diffraction techniques. Ultimate brightness is the key to advancing to a smaller scale, faster response, and higher data measurement and processing rate. The brightness is primarily determined by the electron beam emittance and energy spread at operational intensity. A common feature of fourth-generation synchrotrons is the short length of the electron bunches combined with a very small transverse beam size. Consequently, the high particle density leads to strong collective effects that significantly increase the emittance and limit the achievable brightness at operational beam intensity. In this article, we summarize our studies of the emittance and brightness scaled with the beam energy and intensity, taking into account the effects of intrabeam scattering, beam-impedance interaction and bunch lengthening provided by higher-harmonic RF systems to identify optimal combinations of machine and beam parameters.

36 MATERIALS SCIENCE↗
DOE OSTI2025

Online regularization of Poincaré map of storage rings with Shannon entropy

A measurable chaos indicator is used as the online optimization objective in tuning a complicated nonlinear system—the National Synchrotron Light Source-II storage ring. Through analyzing the Shannon entropy in measured Poincaré maps, not only can the commonly used nonlinear characterizations be extracted, but more importantly, the chaos can be quantified and then used for an online regularization of these maps. The method itself is general and applicable to other tunable nonlinear systems as well. Published by the American Physical Society 2025

36 MATERIALS SCIENCE↗
DOE OSTI2024

Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and Microchips

The resolution of a mega-electron-volt scanning transmission electron microscope (MeV-STEM) is primarily governed by the properties of the incident electron beam and angular broadening effects that occur within thick biological samples and microchips. A precise understanding and mitigation of these constraints require detailed knowledge of beam emittance, aberrations in the STEM column optics, and energy-dependent elastic and inelastic critical angles of the materials being examined. This simulation study proposes a standardized experimental framework for comprehensively assessing beam intensity, divergence, and size at the sample exit. This framework aims to characterize electron-sample interactions, reconcile discrepancies among analytical models, and validate Monte Carlo (MC) simulations for enhanced predictive accuracy. Our numerical findings demonstrate that precise measurements of these parameters, especially angular broadening, are not only feasible but also essential for optimizing imaging resolution in thick biological samples and microchips. By utilizing an electron source with minimal emittance and tailored beam characteristics, along with amorphous ice and silicon samples as biological proxies and microchip materials, this research seeks to optimize electron beam energy by focusing on parameters to improve the resolution in MeV-STEM/TEM. This optimization is particularly crucial for in situ imaging of thick biological samples and for examining microchip defects with nanometer resolutions. Our ultimate goal is to develop a comprehensive mapping of the minimum electron energy required to achieve a nanoscale resolution, taking into account variations in sample thickness, composition, and imaging mode.

36 MATERIALS SCIENCE↗
DOE OSTI2024

3D small-gain formula allowing strong focusing and harmonic lasing for a ring-based x-ray free electron laser oscillator

We present a detailed derivation of a formula for the small-gain calculation for an x-ray free electron laser oscillator (XFELO) based on a medium-energy (3–4 GeV) storage ring. We found harmonic lasing and strong focusing are essential for this beam energy range. Taking the small-signal low-gain formula developed by Kim and his colleagues, we modified it in such a way that the gain can be calculated without the “no focusing approximation,” and a strong focusing can be applied, as well as harmonic lasing. In this formula, the gain is represented as a product of two factors with one of them depending only on the harmonic number, undulator period, and gap. Using this factor, we show that it is favorable to use harmonic lasing to achieve hard x-ray FEL working in the small-signal low-gain regime with the medium-energy electron beam. Our formula also allows FEL optimization by varying the vertical gradient of the undulator, the vertical dispersion, and the horizontal and vertical focusing, independently. As an example, we applied this formula to study the feasibility of an XFELO option for the National Synchrotron Light Source II (NSLS-II) upgrade. Since a quite high peak current is required for the FEL, collective effects of beam dynamics in medium-energy synchrotrons significantly affect the electron beam parameters. We carried out a multiparameter optimization taking collective effects into account. Note, even though our example is for a ring-based XFELO at 3 to 4 GeV, the formula and, in particular, the approach developed here may be applied to other types of FELs. Published by the American Physical Society 2024

36 MATERIALS SCIENCE↗
DOE OSTI2024

Design study of a low emittance complex bend achromat lattice

Light sources worldwide have experienced rapid growth in the last decades, pushing toward higher brightness with lower emittance to meet growing demands from the user community. The quest for higher brightness motivates the development of low-emittance ring lattices. At this point, all fourth-generation storage ring light sources employ variations of the multibend achromat (MBA) lattice. In this paper, we discuss an extension of this approach, known as complex bend achromat lattice in relation to the future NSLS-II upgrade. A detailed approach for the lattice design will be described and the developed lattice will be presented. The advantages of using our complex bend approach are evident in reaching a natural emittance as low as 23 pm at a beam energy of 3 GeV, providing a straight section of 8.4 m for long insertion devices, and acquiring a ratio of about 50% of free space with respect to the ring circumference. The design includes the use of permanent magnets largely reducing the need for power supplies. Our new approach provides an extension to the MBA concept for the next-generation light source lattice design. Published by the American Physical Society 2024

36 MATERIALS SCIENCE↗
DOE OSTI2024

High Harmonic Generation Seeding Echo-Enabled Harmonic Generation toward a Storage Ring-Based Tender and Hard X-ray-Free Electron Laser

To align with the global trend of integrating synchrotron light source (SLS) and free electron laser (FEL) facilities on one site, in line with examples such as SPring-8 and SACLA in Japan and ELETTRA and FERMI in Italy, we actively explore FEL options leveraging the ultralow-emittance electron beam of the NSLS-II upgrade. These options show promising potential for synergy with storage ring (SR) operations, thereby significantly enhancing our facility’s capabilities. Echo-enabled harmonic generation (EEHG) is well-suited to SR-based FELs, and has already been demonstrated with the capability of generating extremely narrow bandwidth as well as high brightness, realized using diffraction-limited short pulses in transverse planes and Fourier transform-limited bandwidth in the soft X-ray spectrum. However, regarding a conventional EEHG scheme, the combination of the shortest seed laser wavelength (256 nm) and highest harmonic (200) sets the short wavelength limit to λ = 1.28 nm. To further extend the short wavelength limit down to the tender and hard X-ray region, a vital option is to shorten the seed laser wavelength. Thanks to recent advances in high harmonic generation (HHG), packing 10 9 photons at one harmonic within a few-femtosecond pulse could turn such a novel HHG source into an ideal seeding for EEHG. Thus, compared to the cascaded EEHG, the HHG seeding option could not only lower the cost, but also free the SR space for accommodating more user beamlines. Moreover, to mitigate the SASE background noise on the sample and detector, we combine the HHG seeding EEHG with the crab cavity short pulse scheme for maximum benefit.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Optimize Electron Beam Energy toward In Situ Imaging of Thick Frozen Bio-Samples with Nanometer Resolution Using MeV-STEM

To optimize electron energy for in situ imaging of large biological samples up to 10 μm in thickness with nanoscale resolutions, we implemented an analytical model based on elastic and inelastic characteristic angles. This model has been benchmarked by Monte Carlo simulations and can be used to predict the transverse beam size broadening as a function of electron energy while the probe beam traverses through the sample. As a result, the optimal choice of the electron beam energy can be realized. In addition, the impact of the dose-limited resolution was analysed. While the sample thickness is less than 10 μm, there exists an optimal electron beam energy below 10 MeV regarding a specific sample thickness. However, for samples thicker than 10 μm, the optimal beam energy is 10 MeV or higher depending on the sample thickness, and the ultimate resolution could become worse with the increase in the sample thickness. Moreover, a MeV-STEM column based on a two-stage lens system can be applied to reduce the beam size from one micron at aperture to one nanometre at the sample with the energy tuning range from 3 to 10 MeV. In conjunction with the state-of-the-art ultralow emittance electron source that we recently implemented, the maximum size of an electron beam when it traverses through an up to 10 μm thick bio-sample can be kept less than 10 nm . This is a critical step toward the in situ imaging of large, thick biological samples with nanometer resolution.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Power loss analysis for optical cavity of X-ray free-electron laser oscillator at 10 KeV

We investigate properties of optical elements in the optical cavity of an X-ray free electron laser oscillator with emphasis on power loss of a monochromatic Gaussian radiation beam upon passing through them using analytical and numerical approaches. Here we assume the optical cavity comprises of refractive lenses and Bragg crystals exploiting symmetric Bragg scattering. For lens, we include the focusing and curvature effects while we include the angular filtering due to finite Darwin width of Bragg crystals. Our results indicate feasibility of Xray power outcoupling in the range of 0.5-28 % with intra-cavity reflectivity of 67-95 % at 10.321 KeV.

43 PARTICLE ACCELERATORS↗
DOE OSTI2024

Power density calculation of spontaneous radiation emission from a finite emittance electron beam in planar undulators

We extend the angular power density formulae for spontaneous radiation emission from planar undulators to include finite emittance and angular misalignment of the electron beam. Then we calculate and compare power densities estimated from integral approach with Gaussian beam distribution and summation approach with macro-particle allocation covering particle beam phase space. After showing that both approaches converge to each other, we apply the macro-particle approach to study power absorbed and transmitted by various apertures at front end of 9-ID beamline at National Synchrotron Light Source-II for misaligned electron beam. Our analysis indicate that the electron beam misalignment could lead to unwarranted power deposition at tighter apertures that would have been otherwise difficult to account for during the aperture design/choice process.

43 PARTICLE ACCELERATORS↗
DOE OSTI2024

Towards Construction of a Novel Nanometer-Resolution MeV-STEM for Imaging Thick Frozen Biological Samples

Driven by life-science applications, a mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed here to image thick frozen biological samples as a conventional Transmission Electron Microscope (TEM) may not be suitable to image samples thicker than 300–500 nm and various volume electron microscopy (EM) techniques either suffering from low resolution, or low speed. The high penetration of inelastic scattering signals of MeV electrons could make the MeV-STEM an appropriate microscope for biological samples as thick as 10 μm or more with a nanoscale resolution, considering the effect of electron energy, beam broadening, and low-dose limit on resolution. The best resolution is inversely related to the sample thickness and changes from 6 nm to 24 nm when the sample thickness increases from 1 μm to 10 μm. To achieve such a resolution in STEM, the imaging electrons must be focused on the specimen with a nm size and an mrad semi-convergence angle. This requires an electron beam emittance of a few picometers, which is ~1000 times smaller than the presently achieved nm emittance, in conjunction with less than 10 -4 energy spread and 1 nA current. We numerically simulated two different approaches that are potentially applicable to build a compact MeV-STEM instrument: (1) DC (Direct Current) gun, aperture, superconducting radio-frequency (SRF) cavities, and STEM column; (2) SRF gun, aperture, SRF cavities, and STEM column. Beam dynamic simulations show promising results, which meet the needs of an MeV-STEM, a few-picometer emittance, less than 10 -4 energy spread, and 0.1–1 nA current from both options. Also, we designed a compact STEM column based on permanent quadrupole quintuplet, not only to demagnify the beam size from 1 μm at the source point to 2 nm at the specimen but also to provide the freedom of changing the magnifications at the specimen and a scanning system to raster the electron beam across the sample with a step size of 2 nm and the repetition rate of 1 MHz. This makes it possible to build a compact MeV-STEM and use it to study thick, large-volume samples in cell biology.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Electron beam emittance at operational intensity in fourth-generation synchrotron light sources

For synchrotron light sources, the brightness of user X-ray beams is primarily determined by the electron beam emittance and energy spread at operational intensity. A common feature of fourth-generation synchrotrons is the short length of electron bunches combined with a very small transverse beam size. Consequently, the particle density is much higher than in machines of previous generations, leading to strong collective effects that significantly increase the emittance and limit the achievable brightness at operational beam intensity. In this article, we summarize our studies of the emittance scaled with the beam energy and intensity, taking into account the effects of intrabeam scattering, beam-impedance interaction, and bunch lengthening provided by higher-harmonic RF systems, to identify optimal combinations of machine and beam parameters.

43 PARTICLE ACCELERATORS↗
DOE OSTI2024

Linear optics compensation for the HEX superconducting wiggler at NSLS-II

At the NSLS-II ring, a 1.2 m long superconducting wiggler with the maximum 4.34T magnetic field has been installed at a low-β straight section (cell 27) to drive the high energy engineering X-ray scattering (HEX) beamline. To mitigate the potential performance degradation due to the linear optics distortion, a local compensation scheme was adopted and confirmed with the online beam measurement. A feedforward control to enable a dynamic compensation of the linear optics distortion was deployed. It can maintain the storage ring lattice performance when the device main coil current ramps.

36 MATERIALS SCIENCE↗
DOE OSTI2023

Optimize electron beam energy toward in-situ imaging of large thick bio-samples with nanometer resolution

To optimize electron energy toward in-situ imaging large bio-samples up to 10-μm thickness with nanoscale resolution, we implemented an analytical model based on elastic and inelastic characteristic angles 1. This model can be used to predict the transverse beam size broadening as a function of electron energy while the probe beam traverses through the sample. As result, the optimal choice of the electron beam energy can be realized. While the sample thickness is less than 10 μm, there exists an optimal electron beam energy below 10 MeV regarding a specific sample thickness. However, for samples thicker than 10 μm, the optimal beam energy is 10 MeV, and the ultimate resolution could become worse with the increase of the sample thickness.

43 PARTICLE ACCELERATORS↗
DOE OSTI2022

Ultracold Storage Ring

The modern ring upgrades aim at reaching beam low emittance while paying little attention to the beam energy spread. The purpose of this note is to conjecture on a possibility of designing a storage ring with ultimately small energy spread. This might be of interest with respect to the following two applications: increasing brightness and coherence of radiation at higher harmonics of undulator radiation and a potential of building a soft X-ray FEL on a storage ring. Throughout the tech note we are taking a 3 GeV storage ring of the NSLS-II size as an example.

43 PARTICLE ACCELERATORS↗
DOE OSTI2022

Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope

Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons is promising for the development of a new instrument for imaging various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.

43 PARTICLE ACCELERATORS↗
DOE OSTI2022

Toward fully automated UED operation using two-stage machine learning model

To demonstrate the feasibility of automating UED operation and diagnosing the machine performance in real time, a two-stage machine learning (ML) model based on self-consistent start-to-end simulations has been implemented. This model will not only provide the machine parameters with adequate precision, toward the full automation of the UED instrument, but also make real-time electron beam information available as single-shot nondestructive diagnostics. Furthermore, based on a deep understanding of the root connection between the electron beam properties and the features of Bragg-diffraction patterns, we have applied the hidden symmetry as model constraints, successfully improving the accuracy of energy spread prediction by a factor of five and making the beam divergence prediction two times faster. The capability enabled by the global optimization via ML provides us with better opportunities for discoveries using near-parallel, bright, and ultrafast electron beams for single-shot imaging. It also enables directly visualizing the dynamics of defects and nanostructured materials, which is impossible using present electron-beam technologies.

36 MATERIALS SCIENCE↗