Search NASASearch

Engineering topics

Shamanna, M.

Publications and source records attributed to Shamanna, M..

On fast carry select adders

This paper presents an architecture for a high-speed carry select adder with very long bit lengths utilizing a conflict-free bypass scheme. The proposed scheme has almost half the number of transistors and is faster than a conventional carry select adder. A comparative study is also made between the proposed adder and a Manchester carry chain adder which shows that the proposed scheme has the same transistor count, without suffering any performance degradation, compared to the Manchester carry chain adder.

Shamanna, M.

Cellular logic array for computation of squares

A cellular logic array is described for squaring binary numbers. This array offers a significant increase in speed, with a relatively small hardware overhead. This improvement is a result of novel implementation of the formula (x + y)exp 2 = x(exp 2) + y(exp 2) + 2(x)(y). These results can also be incorporated in the existing arrays achieving considerable hardware reduction.

Shamanna, M.

Reliable VLSI sequential controllers

A VLSI architecture for synchronous sequential controllers is presented that has attractive qualities for producing reliable circuits. In these circuits, one hardware implementation can realize any flow table with a maximum of 2(exp n) internal states and m inputs. Also all design equations are identical. A real time fault detection means is presented along with a strategy for verifying the correctness of the checking hardware. This self check feature can be employed with no increase in hardware. The architecture can be modified to achieve fail safe designs. With no increase in hardware, an adaptable circuit can be realized that allows replacement of faulty transitions with fault free transitions.

Whitaker, S.

Minimal test set for stuck-at faults in VLSI

Minimal test sets have the property that each input vector simultaneously tests several faults in a network. Existing techniques to determine a minimal set of detection tests rely heavily on complicated algebraic techniques. In this paper, two new methods are presented which do not require Boolean algebra or Karnaugh maps. The first is a graphical approach using fault folding graphs. The second is a design by inspection technique. This work follows the unique approach of first finding all the faults that can be detected by a single test. This tremendously reduces the work required to determine a minimal test set. The design by inspection method could be automated for programmatic generation of minimal stuck-at fault tests.

Shamanna, M.