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Siegrist, K.

Publications and source records attributed to Siegrist, K..

Statistical Analysis of a Debugging Model

Suppose that a system is undergoing a sequence of trials and design changes in an effort to find and eliminate design flaws in the system. Specifically, suppose that each trial is classified as an assignable cause failure (if the failure is due to one or more design flaws), an inherent failure (if the failure is not due to a design flaw), or a success. After each assignable cause failure, the design flaws that caused the failure are removed. In the case of statistically independent and identical design flaws, a probabilistic model is developed to describe this debugging process. Explicit expressions are obtained for the distributions of the important random variables and for the important measures of reliability. Statistical methods are developed for estimating the parameters of the model from accumulated test data.

Siegrist, K.

A Markov chain model for reliability growth and decay

A mathematical model is developed to describe a complex system undergoing a sequence of trials in which there is interaction between the internal states of the system and the outcomes of the trials. For example, the model might describe a system undergoing testing that is redesigned after each failure. The basic assumptions for the model are that the state of the system after a trial depends probabilistically only on the state before the trial and on the outcome of the trial and that the outcome of a trial depends probabilistically only on the state of the system before the trial. It is shown that under these basic assumptions, the successive states form a Markov chain and the successive states and outcomes jointly form a Markov chain. General results are obtained for the transition probabilities, steady-state distributions, etc. A special case studied in detail describes a system that has two possible state ('repaired' and 'unrepaired') undergoing trials that have three possible outcomes ('inherent failure', 'assignable-cause' 'failure' and 'success'). For this model, the reliability function is computed explicitly and an optimal repair policy is obtained.

Siegrist, K.