Surface Dynamics in p-InAs and n-GaAs Probed with Scanning Ultrafast Electron Microscopy (SUEM).
Abstract not provided.
Perez, Christopher↗
Engineering topics
Smoll, Eric
Publications and source records attributed to Smoll, Eric.
Ultrafast Electron Microscopy for Spatial-Temporal Mapping of Charge Carriers
This LDRD supported efforts to significantly advance the scanning ultrafast electron microscope (SUEM) for spatial-temporal mapping of charge carrier dynamics in semiconductor materials and microelectronic devices. Sandia's SUEM capability in Livermore, CA, was built and demonstrated with previous LDRD funding; however, the stability and usability of the tool limited the throughput for analyzing samples. A new laser alignment strategy improved the stability of the SUEM, and the design and characterization of a new micro-channel plate (MCP)- based detector improved the signal-to-noise of the SUEM signal detection. These enhancements to the SUEM system improved throughput by over two orders of magnitude (before, a single time series of SUEM measurements would take several days to several weeks to acquire; now, the same measurements can be completed in~90 minutes in an automated fashion). The SUEM system can now be routinely used as an analytical instrument and will be a central part of several multi-year projects starting in FY22.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗