Engineering topics

Snyder, R. L.

Publications and source records attributed to Snyder, R. L..

3 records

NASA NTRS1974

A method for determining the preferred orientation of crystallites normal to a surface

It is pointed out that in principle all of the preferred-orientation information for the direction normal to a surface will be contained in the intensity differences between X-ray diffraction peaks for a sample with a preferred orientation and one with a fully random crystallite orientation. An experimental investigation is discussed along with questions regarding the procedure used in the evaluation process.

Snyder, R. L.↗

NASA NTRS1973

Crystallographic and general use programs for the XDS Sigma 5 computer

Programs in basic FORTRAN 4 are described, which fall into three catagories: (1) interactive programs to be executed under time sharing (BTM); (2) non interactive programs which are executed in batch processing mode (BPM); and (3) large non interactive programs which require more memory than is available in the normal BPM/BTM operating system and must be run overnight on a special system called XRAY which releases about 45,000 words of memory to the user. Programs in catagories (1) and (2) are stored as FORTRAN source files in the account FSNYDER. Programs in catagory (3) are stored in the XRAY system as load modules. The type of file in account FSNYDER is identified by the first two letters in the name.

Snyder, R. L.↗

NASA NTRS1973

A method for determining the preferred orientation of crystallites normal to a surface

Techniques representing the angular distribution of a particular direction in a crystallographic reference frame or analytical methods were developed. The data required by these techniques for displaying preferred orientation is obtained by measuring the orientation of a large number of crystallites. This may be done visually using etch-pit or Laue techniques which, experimentally, are both tedious and difficult. The intensities of X ray diffraction maxima are proportional to the number of crystallites whose crystallographic plane normals bisect the incident and diffracted beams. Parameters used in calculating powder patterns are also presented.

Snyder, R. L.↗