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Soli, G.

Publications and source records attributed to Soli, G..

6 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1995

Clementine Dosimetry

This paper presents radiation dosimetry results from the radiation and reliability experiments on the Clementine spacecraft and Interstage Adapter Satellite. The dosimetry instruments used low dose response p-channel field effect transistor and proton sensitive static random access memory dosimeters. They were an order of magnitude lower in mass and power than previous systems. A solar proton event early in the mission allowed comparison with another dosimeter in orbit.

dosimeters↗
NASA NTRS1994

Clementine RRELAX SRAM Particle Spectrometer

The Clementine RRELAX radiation monitor chip consists of a p-FET total dose monitor and a 4-kbit SRAM particle spectrometer. Eight of these chips were included in the RRELAX and used to detect the passage of the Clementine (S/C) and the innerstage adapter (ISA) through the earth's radiation belts and the 21-Feb 1994 solar flare. This is the first space flight for this 1.2 micron rad-soft custom CMOS radiation monitor. This paper emphasizes results from the SRAM particle detector which showed that it a) has a detection range of five orders of magnitude relative to the 21-Feb solar flare, b) is not affected by electrons, and c) detected microflares occurring with a 26.5 day period.

Clementine↗
NASA NTRS1993

STRV-RADMON

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RADMON Radiation Monitor SRAM p-FETs CMOS process ↗
NASA NTRS1993

STRV RADMON: An Integrated High-Energy Particle Detector

The RADMON (Radiation Monitor) was developed as a compact device with a 4-kbit SRAM particle detector and two p-FET total dose monitors. Thus it can be used as a spacecraft radiation alarm and in situ total dose monitor. This paper discusses the design and calibration of the SRAM for proton, alpha, and heavy ion detection. Upset rates for the RADMON, based on a newly developed space particle flux algorithm, are shown to vary over eight orders of magnitude.

RADMON↗
NASA NTRS1991

Update on parts SEE suspectibility from heavy ions

JPL and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. All data are conveniently divided into two tables: one for MOS devices, and one for a shorter list of recently tested bipolar devices. In addition, a new table of data for latchup tests only (invariably CMOS processes) is given.

Nichols, D. K.↗