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Steimle, Lawrence J.

Publications and source records attributed to Steimle, Lawrence J..

Method and apparatus for removing unwanted reflections from an interferometer

A device for eliminating unwanted reflections from refractive optical elements in an optical system is provided. The device operates to prevent desired multiple fringe patterns from being obscured by reflections from refractive elements positioned in proximity to a focal plane of the system. The problem occurs when an optical beam is projected into, and reflected back out of, the optical system. Surfaces of the refractive elements reflect portions of the beam which interfere with portions of the beam which are transmitted through the refractive elements. Interference between the reflected and transmitted portions of the beam produce multiple fringe sets which tend to obscure desired interference fringes. With the refractive optical element in close proximity to the focal plane of the system, the undesired reflected light reflects at an angle 180 degrees opposite from the desired transmitted beam. The device exploits the 180-degree offset, or rotational shear, of the undesired reflected light by providing an optical stop for blocking one-half of the cross-section of the test beam. By blocking one-half of the test beam, the undesired offset beam is blocked, while the returning transmitted beam passes into the optical system unaffected. An image is thereby produced from only the desired transmitted beam. In one configuration, the blocking device includes a semicircular aperture which is caused to rotate about the axis of the test beam. By rotating, all portions of the test beam are cyclically projected into the optical system to thereby produce a complete test image. The rotating optical stop is preferably caused to rotate rapidly to eliminate flicker in the resulting image.

Steimle, Lawrence J.

Suppressing Spurious Reflections In An Interferometer

Dynamic-aperture fringe discriminator is simple device enhancing operation of interferometer of spherical-wave-front type used to test lenses, telescopes, and other optical instruments. Device suppresses reflections from surfaces of refractive optical elements in instrument and/or test setup. Reflections from refractive optical components eliminated by blocking half of interferometer aperture.

Steimle, Lawrence J.

Development of a Broadband Achromatic Twyman-Green Interferometer

A modified Twyman-Green interferometer is in use that makes possible wavefront testing of optical filters at any wavelength from 200 to 1100 nanometers. The use of mirrors for collimation and pupil imaging makes the intrument achromatic, and therefore the focus is fixed over the entire bandwidth.

interferometer

Instrument Measures Shift In Focus

Optical components tested at wavelengths from ultraviolet to infrared. Focus-shift-measuring instrument easy to use. Operated in lighted room, without having to make delicate adjustments while peering through microscope. Measures distance along which focal point of converging beam of light shifted by introduction of nominally plane parallel optical component into beam. Intended primarily for measuring focus shifts produced by windows and filters at wavelengths from 120 to 1,100 nanometers. Portable, compact, and relatively inexpensive for degree of precision.

Steimle, Lawrence J.

Broadband, Achromatic Twyman-Green Interferometer

Improved Twyman-Green interferometer used in wave-front testing optical components at wavelengths from 200 to 1,100 nm, without having to readjust focus when changing wavelength. Built to measure aberrations of light passing through optical filters. Collimating and imaging lenses of classical Twyman-Green configuration replaced by single spherical mirror. Field lens replaced by field mirror. Mirrors exhibit no axial chromatic aberration and made to reflect light efficiently over desired broad range of wavelengths.

Steimle, Lawrence J.