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Sun, Yongjie

Publications and source records attributed to Sun, Yongjie.

Dilepton Program with Time-of-Flight Detector at the STAR Experiment

Pairs of lepton and antilepton (dilepton) in a continuous mass range are one of the most experimentally challenging and golden probes of the quark-gluon plasma (QGP) produced in heavy ion collisions because they do not strongly interact with the hot and dense medium, and reflect the properties of the medium at the time the dilepton is generated. The measurements of dileptons require lepton identification with high purity and high efficiency at large detector acceptance. STAR is one of two large experiments at the relativistic heavy ion collider with a primary goal of searching for the QGP and studying its properties. The STAR experiment launched a comprehensive dielectron (e + e - ) program enabled by the time-of-flight (TOF) detector that had been fully installed in 2010. In this article, we review the decade-long R&D, the construction and performance of the STAR TOF detector, and dielectron measurements, including thermal dielectron production and dielectron production from the Breit–Wheeler process. Future perspectives are also discussed.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Quality assurance test of silicon photomultipliers and electronic boards for STAR event plane detector

The event plane detector (EPD), installed in the Solenoid Tracker at the Relativistic Heavy-Ion Collider located at the Brookhaven National Laboratory is a plastic scintillator-based device that measures the reaction centrality and event plane in the forward region of the relativistic heavy-ion collisions. We used silicon photomultiplier (SiPM) arrays to detect the photons produced in the scintillator via the fiber connection. Signals from the SiPM arrays were amplified by the front-end electronic (FEE) board, and sent to the analog-to-digital converter (ADC) boards for further processing via the receiver (RX) board. The full EPD system consisted of 24 super-sectors (SSs); each SS was equipped with two SiPM boards, two FEE boards and two RX boards, and they corresponded to 744 readout channels. All these boards were mass produced at the University of Science and Technology of China, with a dedicated quality assurance (QA) procedures applied to identify any problems before deployment. This article describes the details of the QA method and the related test system. As a result, the QA test results are presented along with the discussions.

EPD↗