Engineering topics

Swift, Gary

Publications and source records attributed to Swift, Gary.

6 records

NASA NTRS2010

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilins Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.

error rate calculations↗

NASA NTRS2008

VIRTEX-4 VQ static SEU Characterization Summary

This report is the result of the combined efforts of members within the Xilinx Radiation Test Consortium (XRTC), sometimes known as the Xilinx SEE Test Consortium. The XRTC is a voluntary association of aerospace entities, including leading aerospace companies, universities and national laboratories, combining resources to characterize reconfigurable FPGAs for aerospace applications. Previous publications of Virtex-4 radiation results are for commercial (non-epitaxial) devices; see, for example, Refs. 1-4. A notable exception is Ref. 5, which presents XRTC upset measurements of storage elements in the PowerPC405s in the XQR4VFX60. This report of upset susceptibility to heavy ions and protons of the static memory elements in the Virtex-4QV family is a direct parallel to the XRTC report on the thin epitaxial devices in the Virtex-2 family released four years ago.

field programmable gate array (FPGA)↗

NASA NTRS2003

SEU mitigation testing of Xilinx Virtex II FPGAs

Explore the source record for details and available documents.

SEE testing↗

NASA NTRS1996

Non-Destructive Measurements for CMOS Devices Using Charge Collection Techniques

UNKNOWN

device↗

NASA NTRS1995

Total Dose Responses of Actel 1020B and 1280A Field Programmable Gate Arrays (FPGAs)

Gamma irradiation and annealing of a large number of Actel FPGAs with in-situ current measurements were performed. Lot-to-lot, part-to-part, and burn in variations were measured. Findings include a catastrophic failure mechanism and minimal dose rate effects.

Actel 1020B 1280A↗

NASA NTRS1995

An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET, angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.

Survey↗