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TamizhMani, GovindaSamy

Publications and source records attributed to TamizhMani, GovindaSamy.

Artificial Replication of Field Soiling Losses on PV Modules

In this paper, we experimentally demonstrate an improved replication of field soiling losses using an indoor artificial soiling chamber and tests on anti-soiling coated PV modules and coupons. The primary focus is to use site-specific soil collected from module surface and replicate the natural soiling processes including dust concentration in the air, slow and gradual dust accumulation and sedimentation on the module surface during the dominant soiling season of the site of interest. The experiments were conducted on two sample sets having different anti-soiling properties. The first set contains commercial modules with two different surface properties retrieved after three years of exposure from a single PV plant in a mid-Atlantic location; the other set contain glass coupons with three different coating materials that were installed and exposed over 4 months, at Lemoore, California. Major field-representative factors considered here for the close replication in the chamber include: the use of dust collected from modules surfaces at the outdoor sites to give the same dust chemistry; dust particle size distribution and concentration; the charge size of dust (< 0.15 g per injection); field humidity, and module temperature. The effectiveness of antisoiling coatings (or surface properties) for both sample sets were ranked in the artificial testing and were found to be closely matching with the field rank orders of the respective sites and sample sets. This paper provides the rank ordering results to objectively demonstrate the replication of field soiling losses in the artificial soiling chamber.

artificial soiling↗

Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module: Preprint

Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m2 and 6.2% at 200 W/m2. Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.

PERC↗

Examining Light-Induced Degradation with Combined-Accelerated Stress Testing

While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).

combined-accelerated stress testing↗

Comparative Analysis of Hotspot Stress Endurance in Pristine and Thermal Cycled Prestressed Glass–Glass Photovoltaic Modules

Hotspots pose a significant long-term reliability challenge in photovoltaic (PV) modules that can have a detrimental impact on the efficiency, safety, and financial viability of a PV system. This paper aims to evaluate the endurance of hotspot stress in pristine and prestressed glass–glass (GG) modules. The accelerated prestressing was conducted for 600 thermal cycles (TC600) to represent decades of field exposure. GG modules are quickly becoming an alternative to the traditional glass–backsheet (GB) modules that have been the industry standard. Unlike other conventional studies that subject only pristine modules to hotspot stress, this paper evaluates the performance of an accelerated/simulated field-aged GG module (using TC600) and a pristine GG module. Pre- and post-characterizations were performed before and after each test to determine changes in electrical performance and observe any defects in GG modules. During the hotspot test, an approximately 200 °C maximum cell temperature was observed with a cell shading of 25% (the worst-case shading ratio). After the hotspot test, electroluminescence imaging indicated that most cells in the prestressed GG module exhibited severe damage whereas no significant defects were evident in the pristine GG module where the prestressed GG module degraded 8.2% and the pristine GG module degraded 1.5% in maximum power. These findings are critical for the industry, considering that GG bifacial modules will dominate the market.

14 SOLAR ENERGY↗

Degradation of Monocrystalline Silicon Photovoltaic Modules From a 10-Year-Old Rooftop System in Florida

A system of 180 monocrystalline aluminum back-surface field modules were installed in Cocoa, Florida, for 10 years. In total, 156 modules are characterized and compared to 3 controls. Power degradation rates vary between – 0.14% to – 3.22% per year, with median and average rates of –0.92% and –1.05% per year, respectively. The losses are primarily resistive with minor optical and recombination loss contributions. Electroluminescence imaging shows a characteristic pattern, which is shown to be resistive in nature when compared to photoluminescence. Resistive losses are due to corrosion of the rear contact Ag/solder interface and, to a much lesser degree, gridline Ag oxidation. Moisture ingress through the backsheet is likely responsible for mediating corrosion. Optical losses are due mostly to a combination of antireflection coating degradation, minor encapsulant browning, and delamination. Minor front contact corrosion may contribute to recombination. Furthermore, this study expands upon previous work on this vintage of the module by examining a large sample set, comprehensive characterization including techniques not previously used on these modules, and a comparison between two other systems of different climates.

14 SOLAR ENERGY↗

Extended Accelerated Stress Testing (EAST) of Glass/Glass, Glass/Backsheet and Glass/Transparent Backsheet PV Modules: Influence of EVA and POE Encapsulants: Preprint

This paper presents the indoor extended accelerated stress testing (EAST) results of glass/glass (GG), glass/backsheet (GB) and glass/transparent backsheet (GT) modules having identical cells and two different encapsulant types, ethyl-vinyl-acetate (EVA) and polyolefin-elastomer (POE). Six 4-cell modules having the above-mentioned construction combinations were subjected to extended ultraviolet (UV; 600 kWh/m2), damp-heat (DH; 2000 hours) and thermal-cycling (TC; 600 cycles) tests. The post-stress UV fluorescent imaging, electroluminescent imaging, reflectance spectrophotometry and colorimetry results indicated that the grid finger degradation and encapsulant browning are slightly higher in the GG modules compared to the GB modules. The post-stress IV test results indicated, in general, that the GG/EVA modules tend to perform inferior to the GG/POE modules with the EAST evaluation.

EVA↗

Evaluation of Bifacial Modules and PV Technologies with Combined-Accelerated Stress Testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. This is attributed to previous x-ray topography work showing higher stress in cells in glass-glass modules than glass backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. Finally, among multiple cell degradation modes that we observed such as light-induced degradation (LID), we differentiated susceptibility to potential-induced degradation (PID) on the back of the bifacial Passivated Emitter Back Cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass/glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while -1200 V system voltage is applied in C-AST, supporting the conclusion that this module type would be susceptible to PID in the field.

bifacial modules↗

Reliability Evaluation of Bifacial and Monofacial Glass/Glass Modules with EVA and non-EVA Encapsulants

The market share for bifacial modules is projected to be doubled from 30% to 60% in the next ten years. For the monofacial crystalline silicon glass/backsheet (G/B) modules, extensive reliability data has been available for over 40 years. However, practically little/no long-term field or accelerated reliability test data is available for the new generation glass/glass (G/G) bifacial modules and glass/transparent (G/T) bifacial modules. Therefore, the primary motivation of this project was to identify the reliability strengths and weaknesses of new generation G/G modules compared to G/B modules. In this 3-year project, the goal was to objectively recommend the best construction materials for the new generation G/G (bifacial) modules through a systematic experimental approach with appropriate tasks including: Evaluation of field retrieved old-generation G/G modules; Inspection of new-generation G/G modules installed in the plants; Evaluation of new-generation G/G, G/B and G/T modules using EAST (Extended Accelerated Stress Testing), CAST (Combined Accelerated Stress Testing) and FAST (Field Accelerated Stress Testing); and, dynamic literature search and review. Major accomplishments and outcomes of this project are: Accomplishments: Evaluated more than 60 field retrieved modules and constructed and characterized more than 135 mini-modules with three substrate types (G, B, and T), two encapsulant types (EVA and POE), and two cell types (monofacial and bifacial) as well as evaluated more than 30 commercial G/G and G/B modules; Subjected all the modules to multitude characterization tests and various indoor and outdoor accelerated stress tests including FAST (Field Accelerated Stress Testing), EAST (Extended Accelerated Stress Testing), and CAST (Combined Accelerated Stress Testing) to identify and correlate the failure modes in both field and lab tests. Outcomes: Based on the accelerated test results and handling/mounting experience obtained in this project, the recommended best construction for the glass/glass modules is: “Framed GG modules with cut-cells and POE encapsulant (UVpass front; UVpass back).” However, from a statistical and manufacturing point of view (along with stakeholders surveys), the following cautionary notes are added to the above-mentioned recommendation: (i) Cut cells could introduce a higher level of manufacturing issues, including a higher number of cell interconnects; (ii) POE encapsulant is more expensive than EVA and could present a delamination risk and lower throughput during manufacturing due to lower adhesion strength. Other encapsulants, such as coextruded EPE (EVA/POE/EVA), are also recommended to be investigated. The potential public benefit of the proposed project is to present the strengths and weaknesses of glass/glass modules, so an informed procurement decision can be made.

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Thermally Conductive Backsheets (TCB) of PV Modules: Positive Impacts on Performance, Lifetime and LCOE

The operating temperatures of photovoltaic (PV) modules can be impacted by the selection of specific packaging materials, e.g., backsheets and encapsulants. This research focuses on the evaluation of operating temperature reduction of one-cell modules by comparing conventional Tedlar/polyester/Tedlar (TPT) backsheet with novel thermally conductive backsheets (TCBs) materials. A large number of one-cell modules with two TCB types (TCB_A and TCB_B) and baseline TPT type were fabricated and installed in three different climatic conditions of the hot-dry desert in Arizona (high and low wind speed locations) and North Carolina (temperate with low wind speed location). In this study, these two TCBs were compared with conventional TPT backsheet in terms of performance, lifetime and levelized cost of energy (LCOE). The field results were analyzed for thermal performance of TCBs compared to TPT at three sites for two and half years. This study concludes that the thermal and electrical performances of the PV modules can be improved by using TCB_A in hot and dry climate sites and TCB_B at temperate climate sites. Therefore, the lifetime of TCB-based modules is expected to be higher than TPT-based modules. Using backsheet-specific power degradation levels and assuming the same cost for both types of backsheets, the LCOE of modules using TCBs is estimated to be lower than that of TPT.

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Field Accelerated Stress Testing (FAST): Forecasting Plant-specific Failure Modes and Degradation Rates

Photovoltaic plant owners and insurance companies would like to be prepared for the forthcoming material warranty claims (material defects) and power warranty claims (degradation rate). To address the needs of these stakeholders, this presentation aims to introduce a new conceptual approach to perform accelerated testing right at the field of interest and it is called field accelerated stress testing (FAST). The primary goal of this presentation is to present a conceptual approach to forecast the field specific failure modes and degradation rates in advance by a factor of 2 to 5, right at the plant site using a few spare modules available at the plant location itself.

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Non-contact Current-Voltage (I-V) Tracer for Photovoltaics

This report presents a non-contact approach to simultaneously obtain current-voltage (I-V) curves of photovoltaic (PV) substrings and modules in a string without the need of disconnecting the individual modules from the string. There are two types of I-V curve tracers currently available in the marketplace, capacitor-based and electronic load-based. The primary requirement of these conventional I-V tracers is the disconnection of individual modules in the string so the individual modules contacted through the connectors of the individual modules. These contact-tracers have three major limitations in the utility scale power plants: First limitation – Weather and Accuracy: The mass-produced commercial contact-tracers cannot obtain the I-V curves of both string and its modules (as high as 30 modules), almost simultaneously (within about 5 minutes) at, practically, a single irradiance level, a single module temperature, a single spectrum and a single AOI (angle of incidence). This inability of the contact-tracers forces the testing personnel to wait for an extended or multiple sunny (>800 W/m 2 ) duration(s) of a cloudy day. This is a serious limitation as waiting for the sunny conditions or days is a huge practical challenge in almost all locations, except desert locations. Also, since the I-V curves are obtained at different prevailing weather conditions, it becomes critical to translate all the measured I-V curves of 30 modules in the string to a single test condition, for example STC (standard test conditions), so the underperforming modules can be identified. The accuracy of translation equations is heavily influenced by the irradiance level and temperature, spectral and AOI ranges; Second limitation - Safety: The second limitation is related to the high voltage electrical safety of the test personnel during disconnecting and reconnecting of individual modules or cable connectors from the string under daylight conditions and damaging of the original module connectors (especially the field aged connectors) during the disconnecting and reconnecting process; Third limitation – Labor: The third limitation is related to the enormous amount of time and hardship for the test personnel under prevailing (often harsh) protracted field conditions. This project was executed by Arizona State University in collaboration with its industry partner, PV Measurements Inc. (PVM). To mitigate all the three challenges of the state-of-the-art equipment indicated above, we utilized a non-contact I-V (NCIV) tracer approach. In this approach, we utilized an electrostatic voltmeter (ESV) and voltage sensor/probe combination to obtain I-V curves. The ESV units are extensively used in the high voltage industry but not in the PV industry. To obtain the simultaneous I-V curves of the substrings and modules within a string, we utilized multiple commercial ESV-Probe sets. In this approach, we utilized a non-contact voltage sensor (called, Probe) placed on the glass surface of the module (above the last cell of the module). This probe senses the module voltage (with respect to ground) through measured capacitance which is dictated by the surface charges (which in turn is dictated by the module voltage) and transmits the sensed voltage to the voltmeter (called, ESV or NCV, non-contact voltmeter). The current is sensed by a non-contact hall sensor. In a 30-module string, the 30th probe obtains the entire string I-V along with the string I-V obtained by the electronic load. so that the I-V curves of the substrings and modules can be obtained by NCIV without the need of disconnecting the individual modules in the string. The string I-V curves obtained by the electronic load and NCIV can be compared for the accuracy determination. One can use 30 ESV units and 30 Probes to obtain 30 I-V curves of a 30-module string or use just 5 ESV units and 30 Probes in conjunction with 5 six-channel switchboxes (called, 6:1 switchboxes). To reduce the equipment cost, we utilized the 6:1 switchbox approach so the number of ESV units is reduced from 30 to 5. The approaches, achievements and challenges of this project are detailed in this report.

14 SOLAR ENERGY↗

Prediction of Climate-Specific Degradation Rate for Photovoltaic Encapsulant Discoloration

Encapsulant discoloration is a well-known field degradation mode of crystalline-silicon photovoltaic modules, particularly in the hot climate zones. The discoloration rate is influenced by several weathering factors, such as UV light, module temperature, and humidity, as well as the permeability of oxygen into the module. Here, a rate dependence model employing the modified Arrhenius equations to predict the degradation rate for encapsulant discoloration in different climates is presented. Two modeling approaches are introduced, which utilize the field and accelerated UV testing degradation data in conjunction with the field meteorological data to determine the acceleration factor for encapsulant browning. A novel method of accelerated UV stress testing at three simultaneous module temperatures in a single environmental chamber test run is implemented to estimate the activation energy for browning. The test was performed on three field-retrieved modules to capture the wear-out failure mechanism. The degradation in short-circuit current Isc rather than maximum power is used as a decisive parameter for the discoloration analysis. Furthermore, the developed model has been used to predict the Isc degradation rate for the Arizona field characterized by a hot and dry climate and is validated against the field-measured value. It has also been applied to other climate types, e.g., the cold and dry climate of New York.

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Field Reliability of Glass/Glass Modules

A review of literature indicates that there will be a 20% increase in utilization of glass/glass PV modules by 2023. Common degradation modes reported in literature of glass/glass modules are: Encapsulant delamination, Encapsulant browning, corrosion and glass cracks. There is a strong need to investigate the reliability of glass/glass modules in detail to identify and overcome any potential failures in the future constructions. This work presents a preliminary literature review on the reliability of old generation glass/glass modules in the field.

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