Evaluation of COTS Electronics by Power Spectrum Analysis and Multivariate Data Analysis
Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining commercial off-the-shelf ( COTS ) electronic components. These features make PSA attractive for both component screening and surveillance in support of component reliability efforts. Current analysis methods limit the utility of PSA due to the need to manually examine the results of analysis to identify anomalous parts. This study demonstrates the development and application of a workflow to automate the screening of COTS electronic components. Further, this study demonstrates the use of multivariate algorithms to assess aging of Zener diodes. These workflows can be readily extended to other components, combining the benefits of PSA and multivariate analysis to screen and evaluate COTS electronic components.