Photovoltaic cable jackets A comparison of representative products using combined-accelerated stress testing
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Miller, David C. (ORCID:0000000246985277)↗
Engineering topics
Terwilliger, Kent
Publications and source records attributed to Terwilliger, Kent.
Diagnosis of PV Cell Passivation Degradation Resulting from Hot-Humid, High Voltage Potential Aging
Corrosion of the antireflective coating on the cell ("AR c corrosion") was previously observed in studies using hot-humid test conditions with external high voltage (HV) bias. Because AR c corrosion is not well understood, mini-modules (MiMos) were examined in a comparative experiment using PERC and PERT as well as legacy Al-BSF cells. For separate MiMos with the cell circuit electrical at +1500 V, -1500 V, or unbiased "V oc", test conditions in the comparative study included 60degrees C/60% RH for 96 h, as in IEC TS 62804-1; 70degrees C/70%RH for 200 h; and 85degrees C/85% RH for 200 h. Characterizations at each read point included: camera and electroluminescence (EL) imaging, colorimetry, and I-V curve tracing. Characterizations at the final read point included: SunsVoc; spatially mapping external quantum efficiency (EQE); high resolution: photoluminescence (PL), EL, and dark lock-in thermographic (DLIT) imaging. Forensics were performed on extracted cores, including scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDS) and scanning Auger microscopy (SAM). Forensics were also conducted on MiMos (stepped HV aging) and full-sized modules (outdoor aging) from previous studies. AR c corrosion was specifically observed for the glass/encapsulant/cell side of +1500 V (HV+) stressed MiMos, where appearance, color, and reflectance were the characteristics most distinguished relative to simultaneously occurring degradation modes. SEM/EDS and SAM identified conversion of silicon nitride to silicon oxide or hydrous silica, preferentially occurring at the edges and tips of the pyramidal textured cell surface.
aging↗
Photovoltaic Cable Connectors: A Comparative Assessment of the Present State of the Industry
The consequences of failure for balance-of-systems components (such as photovoltaic (PV) cable connectors) include offline module string(s); low system voltage; arc, ground, insulation, and overtemperature faults; triggered fuse(s); system shutdown; and fire. The degradation modes for connectors are studied here through an industry survey and its subsequent examination, which are compared with field-degraded specimens. A total of 117 specimens were obtained from a variety of locations and climates or accelerated tests. A failure analysis for connectors from PV installations was developed (and applied to 54 specimens), including nondestructive examinations (photography, a custom resistance-current scan, and X-ray computed tomography) and destructive examinations (featuring milling of the external plastic, extraction of the internal convolute spring, and potting and polishing in cross section). Surface and through-thickness composition of the metal pins and springs was quantified using scanning electron microscopy with energy-dispersive X-ray spectroscopy. Fourier transform infrared spectroscopy was used to verify the base polymer materials and compare the chemical structure of the connector body, bushing, end nut, and o-ring. Thermogravimetric analysis and differential scanning calorimetry were used to further verify the degradation of the same polymeric components.
cable connectors↗
Photovoltaic Cable Connectors: A Comparative Assessment of the Present State of the Industry [Slides]
The consequences of failure for balance of systems (BoS) components (such as PV cable connectors) include offline module string(s); low system voltage; arc, ground, insulation, and over-temperature faults; triggered fuse(s); system shutdown; and fire. The degradation modes for connectors are studied here through an industry survey and its subsequent examination, which are compared to field-degraded specimens. 117 specimens were obtained from a variety of locations and climates or accelerated tests. A failure analysis for connectors from PV installations was developed (and applied to 54 specimens) including nondestructive examinations (photography, a custom resistance-current scan, and X-ray computed tomography) and destructive examinations (featuring milling of the external plastic, extraction of the internal convolute spring, and potting and polishing in cross-section). Surface and through-thickness composition of the metal pins and springs was quantified using scanning electron microscopy with energy-dispersive X-ray spectroscopy. Fourier-transform infrared spectroscopy was used to verify the base polymer materials and compare the chemical structure of the connector body, bushing, end nut, and o-ring. Thermogravimetric analysis and differential scanning calorimetry were used to further verify the degradation of the same polymeric components. Updated from 2023 NIST/UL Workshop on Photovoltaic Materials Durability (website: https://events.ul.com/WPMogn?rt=aAuoWsl4E0KaORLCMeOgfA) and 2024 PVRW workshop (https://pvrw.nrel.gov/past-proceedings).
14 SOLAR ENERGY↗
Material characterization of seven photovoltaic backsheets using seven accelerated test conditions
A variety of polymeric backsheet materials can be found in fielded photovoltaic (PV) modules, mostly based on fluoropolymer and polyethylene terephthalate (PET) materials. Cost reduction and sustainability considerations drive the recent development of alternative backsheet materials and designs [1]. In some fielded PV installations, polymeric materials are susceptible to environmental degradation in the form of backsheet cracking. To prevent backsheet degradation that can result in a module failure, thorough laboratory reliability testing is needed. In this report we studied the durability of seven commercial and experimental PV backsheets through accelerated stress testing using seven photolytic, hygrometric, and custom tests with the goal to understand if novel fluoropolymer-free backsheets are sufficiently environmentally durable to be commercialized. We divided the mechanisms observed during aging into two categories: core degradation and surface degradation. Although core degradation due to hydrolysis was observed in all commercial PET-, and polyamide (PA)-based backsheets aged with 85 degrees C/85% relative humidity, this test is unlikely to be field relevant. Photo-oxidative reactions on the exposed surface during UV weathering affected all seven backsheets regardless of the outer layer polymer material and additives. This degradation was limited to the outermost micrometers of the surface, except for backsheets containing PA-12, which resulted in surface cracking. A custom test combining UV with water spray caused the most severe backsheet degradation, including surface erosion and loss of insulating properties in polyolefin (PO)- and PA-based backsheets. This highlights the importance of combined accelerated stress testing to screen for complex backsheet degradation mechanisms. We also showed that, with material and design optimization, coextruded experimental PO-based backsheets have the potential to be a durable alternative to commercial PET- and fluoropolymer-based PV backsheets.
14 SOLAR ENERGY↗
Luminescence and Thermal Imaging Applied to Half-Cut-Cell and Emitter-Wrap-Through-Cell Modules
Imaging techniques provide spatial details and visualization of module defects and degradation mechanisms that affect energy conversion efficiency and performance. We apply photoluminescence, electroluminescence, and dark lock-in thermography imaging techniques to evaluate new modules in their initial state and after applying stresses of damp heat, light-induced-degradation regeneration parameters, thermal cycling, and humidity-freeze cycles. One module uses emitter-wrap-through cells with back contacts connected to a metal-foil backplane, and the other is composed of half-cut cells. Imaging shows examples on non-uniform degradation and damage such as cells that degrade and recover under the applied conditions, cells with cracks and handling damage, and cells with increasing series resistance.
degradation↗
Accelerated Aging of PV Cables - The Development of Methods Towards Combined-Accelerated Stress Testing
PV cables allow the collection and distribution of electricity from modules to the energy grid. Durable cabling allows continuous operation of PV installations. Cables with a life less than that of the modules must be replaced - reducing electricity generation and adding to the system operating expense. We have examined the durability of a variety of representative cable samples using artificial UV weathering (IEC TS 62788-7-2) and combined accelerated stress testing (C-AST). Jackets in this study include PV-rated (polyolefin), building wire (PVC/PA), and multi-conductor (rubber, as in PV trackers), with some examples of black and red cables. Characterizations at read points include appearance (camera and optical microscope), surface roughness (linear profilometry), instrumented indentation, surface morphology (SEM), chemical composition (EDS), thermal decomposition (TGA), phase transition (DSC), crystalline structure (WAXS), and polymer chemical structure (FTIR). Complimentary examinations confirm damage to the external and interior layer(s) of less durable samples, including changes in morphology (e.g., cracking), chemistry (e.g., oxidation), structure, and mechanical performance (e.g., through-thickness modulus and hardness). The results may be generally compared to other examples from the field (PV installations) or after accelerated testing (IEC 61215). The methods in this study are presently being applied in a follow-on C-AST study, incorporating both dynamic and kinematic fixtures.
balance of systems↗
Examining Light-Induced Degradation with Combined-Accelerated Stress Testing
While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).
combined-accelerated stress testing↗
Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging
Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini-modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor-accelerated stress testing or outdoor deployment. Distinct spatial patterns in the EL images emerge, which depend on the external stress conditions experienced by the mini-module. Imaging results highlight a distribution of dark speckle features that dominate after UV stress, attributed to widespread interfacial contact degradation. Lateral intensity gradients across cells dominate after thermal cycling (TC) stress, attributed to current crowding near scribe defects. While current–voltage analysis alone does not give full insight on the degradation process, this study shows that distinct degradation modes can be further defined by multimodal electro-optical imaging (i.e., EL combined with photoluminescence and dark lock-in thermography). Neither UV exposure nor TC-accelerated stress testing alone replicates the same degradation signatures observed after outdoor deployment, suggesting that multiple degradation modes occur under concurrent stressors outdoors. Finally, spatial characterization of degradation modes in MHP PV mini-modules before and after accelerated stress testing lays the groundwork for developing targeted accelerated stress testing procedures through comparison with outdoor aging.
14 SOLAR ENERGY↗
Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing
The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include offline modules, strings, and inverters; system shutdown; arc faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector, and discrete fuse components. In this study, unused field-vintage specimens are examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for the C-AST chamber. The benchtop experiments were also used to develop the in-situ data acquisition of specimen current, voltage, and temperature. A significant increase in operating temperature (~100 degrees C from ~40 degrees C) and a different failure mode were observed promptly once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow for failure analysis, including the extraction of the internal convolute springs for morphological examination (optical and electron microscopy).
balance of systems↗
Arrhenius Analysis of the Degradation Modes in Emerging Photovoltaic Backsheets
With increasingly large-scale deployments of photovoltaic (PV) modules to meet global energy demands, interest in better establishing modules' lifespans is growing. We report on the performance of co-extruded polyolefin- (PO)-based backsheets as environmentally friendly alternatives to fluoropolymer-reinforced polyethylene-terephthalate (PET)-based backsheets using three hygrometric accelerated test conditions. After completing cumulative 4000 hours of aging, we analyzed data from electrical performance (I-V), surface roughness (gloss), and appearance (L, a*, b* color) characterizations to quantify degradation rates, quantify the corresponding activation energy, and cross-correlate between the characteristics examined, thereby providing insights into the relationship between physical characteristics and operating performance.
BackFLIP↗
Evaluation of bifacial module technologies with combined–accelerated stress testing
In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.
14 SOLAR ENERGY↗
Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing
The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include offline modules, strings, and inverters; system shutdown; arc faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector, and discrete fuse components. Previous papers and presentations have focused on the development of the test method using a benchtop prototype. This presentation covers the early results of C-AST aging of static and dynamic specimens.
balance of systems↗
Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing: Preprint
The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include: offline-modules, -strings, -inverters; system shutdown; arc-faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector, and discrete fuse components. Unused field-vintage specimens are presently being examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for the C-AST chamber. The benchtop experiments were also used to develop the in-situ data acquisition of specimen: current, voltage, and temperature. A significant increase in operating temperature, ~100 deg C from ~40 deg C, and a different failure mode was observed promptly once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow failure analysis, including the extraction of the internal convolute springs for morphological examination (optical- and electron-microscopy).
balance of systems↗
Development of Fixtures and Methods to Assess the Durability of Balance of Systems Components
The degradation of photovoltaic (PV) balance of systems (BoS) components is not well studied, but the consequences include offline modules, strings, and inverters; system shutdown; arc faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were, therefore, examined, consisting of cable connector, branch connector, and discrete fuse components. In this study, unused field-vintage specimens are examined using a benchtop prototype fixture to identify the most influential environmental stressors on BoS components as well as the effect of external mechanical perturbation. The prototype fixture was used to develop a perturbation capability for future use in the combined-accelerated stress testing chamber. The benchtop experiments were also used to develop the in-situ data acquisition of specimen current, voltage, and temperature. A significant increase in operating temperature (~100 °C from ~40 °C) and a different failure mode (arcing at the metal pins rather than overheating of the fuse filament) were observed promptly once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (measured for static specimens, with failure occurring in the fuses) to 15 A (for tests with mechanical perturbation, with failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow for failure analysis, including the extraction of the internal convolute springs for morphological examination (optical and electron microscopy). Chemical composition analysis included energy-dispersive X-ray spectroscopy, differential scanning calorimetry, and Fourier transform infrared spectroscopy.
14 SOLAR ENERGY↗
Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing
The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include: offline-modules, -strings, -inverters; system shutdown; arc-faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector and discrete fuse components. Unused field-vintage specimens are presently being examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for C-AST. The benchtop experiments were also used to develop the in-situ data acquisition of specimen: current, voltage, and temperature. A significant increase in operating temperature, ~100 deg C from ~40 deg C, and a different failure mode was observed immediately once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure occurring in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow failure analysis, including the extraction of the internal convolute springs for morphological examination (optical- and electron-microscopy). Chemical composition analysis included: energy-dispersive X-ray spectroscopy, differential scanning calorimetry, and Fourier transform infrared spectroscopy.
balance of systems↗
UV‐induced degradation of high‐efficiency silicon PV modules with different cell architectures
Abstract Degradation from ultraviolet (UV) radiation has become prevalent in the front of solar cells due to the introduction of UV‐transmitting encapsulants in photovoltaic (PV) module construction. Here, we examine UV‐induced degradation (UVID) in various commercial, unencapsulated crystalline silicon cell technologies, including bifacial silicon heterojunction (HJ), interdigitated back contact (IBC), passivated emitter and rear contact (PERC), and passivated emitter rear totally diffused (PERT) solar cells. We performed UV exposure tests using UVA‐340 fluorescent lamps at 1.24 W·m −2 (at 340 nm) and 45°C through 4.02 MJ·m −2 (2000 h). Our results showed that modern cell architectures are more vulnerable to UVID, leading to a significant power decrease (−3.6% on average; −11.8% maximum) compared with the conventional aluminum back surface field (Al‐BSF) cells (<−1% on average). The power degradation is largely caused by the decrease in short‐circuit current and open‐circuit voltage. A greater power decrease is observed in bifacial cells with rear‐side exposure compared with those with front‐side exposure, indicating that the rear side is more susceptible to UV damage. Secondary ion mass spectroscopy (SIMS) confirmed an increase in hydrogen concentration near the Si/passivation interface in HJ and IBC cells after UV exposure; the excess of hydrogen could result in hydrogen‐induced degradation and subsequently cause higher recombination losses. Additionally, surface oxidation and hot‐carrier damage were identified in PERT cells. Using a spectral‐based analysis, we obtained an acceleration factor of 5× between unpackaged cells (containing a silicon nitride antireflective coating on the front) in the UV test and an encapsulated module (with the front glass and encapsulant blocking 90% of the UV at 294 nm and 353 nm, respectively) in outdoor conditions. From the analytical calculations, we show that a UV‐blocking encapsulant can reduce UV transmission in the module by an additional factor of ~50.
14 SOLAR ENERGY↗
Arrhenius Analysis of the Degradation Modes in BackFLIP Study of Emerging Photovoltaic Backsheets: Preprint
With increasingly large-scale deployments of photovoltaic (PV) modules to meet global energy demands, interest in better establishing module lifespans is growing. We report on the performance of co-extruded polyolefin- (PO) based backsheets as environmentally friendly alternatives to fluoropolymer-reinforced polyethylene-terephthalate- (PET)-based backsheets using three hygrometric accelerated test conditions. After completing 4000 cumulative hours of aging, we analyzed data from electrical performance (I-V), surface roughness (gloss), and appearance (L, a*, b* color) characterizations are analyzed to quantify degradation rates, quantify the corresponding activation energy, and cross-correlate between the characteristics examined, thereby providing insights into the relationship between physical characteristics and operating performance.
BackFLIP↗